Machine function analysis with radar plot
AssigneeOnline Development, Inc.
InventorsKeith A. Walton, Kai T. Bouse
Life of this patent
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AssigneeOnline Development, Inc.
InventorsKeith A. Walton, Kai T. Bouse
Estimating the term…
A system and method for detecting abnormal operating conditions in a machine through the analysis and comparison of radar areas after the transformation of waveform data collected from machine parts. An example embodiment is configured to: generate a monitoring signal in response to the behavior of a machine while the machine is in operation; simultaneously monitor two or more spectrums in the monitoring signal; collect data for two ore more spectrums at times when the machine is operating normally to establish an operational baseline of said machine; identify a respective energy level in each of the two or more spectrums; process waveform data corresponding to each of said identified energy levels into a Fast Fourier Transform radar plot; determine an area that corresponds to the FFT radar plot; correlate changes in the area of the FFT radar plot with changes in spectrum data and changes in the operation of the machine.
A method for identifying abnormal operation of a machine, said method comprising:
Dependencies are inferred from the claim text.