Thermal management system for a test-and-measurement probe
AssigneeTektronix, Inc.
InventorsMatthew J. Hull, Julie A. Campbell, David Thomas Engquist
Life of this patent
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AssigneeTektronix, Inc.
InventorsMatthew J. Hull, Julie A. Campbell, David Thomas Engquist
Estimating the term…
A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit. The shroud is configured to enclose a first portion of a test-and-measurement probe within an interior cavity of the shroud, while permitting a second portion of the test-and-measurement probe head to extend out of the shroud into a testing environment. The shroud further includes a fluid outlet passageway configured to permit a heat-transfer fluid to pass from a probe-head end of the interior cavity, through the interior cavity of the shroud, and out of the shroud through an access portion of the shroud. A fluid inlet conduit enters the shroud through an access portion of the shroud, extends through the interior cavity of the shroud, and is configured to introduce a heat-transfer fluid to a probe-head portion of the test-and-measurement probe.
A thermal management system for a test-and-measurement probe, the thermal management system comprising:
A method of managing temperature of a test-and-measurement probe, the method comprising:
Dependencies are inferred from the claim text.