Semiconductor device
AssigneeHitachi Power Semiconductor Device, Ltd.
InventorsNaoki Takeda, Hisashi Tanie, Kisho Ashida, Yu Harubeppu, Tomohiro Onda, Masato Nakamura
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi Power Semiconductor Device, Ltd.
InventorsNaoki Takeda, Hisashi Tanie, Kisho Ashida, Yu Harubeppu, Tomohiro Onda, Masato Nakamura
Estimating the term…
Provide is a highly reliable semiconductor device in which stress generated in a semiconductor chip is reduced and an increase in thermal resistance is suppressed. The semiconductor device includes: a semiconductor chip including a first main electrode on one surface thereof and a second main electrode and a gate electrode on the other surface thereof; a first electrode connected to the one surface of the semiconductor chip via a first bonding material; and a second electrode connected to the other surface of the semiconductor chip via a second bonding material. The first electrode is a plate-shaped electrode and has a groove in a region overlapping with the semiconductor chip. The groove penetrates in a thickness direction of the first electrode and reaches an end portion of the first electrode when viewed in a plan view.
A semiconductor device comprising:
Dependencies are inferred from the claim text.