Apparatus for processing substrate
AssigneeTokyo Electron Limited
InventorMasahiro Tabata
Life of this patent
Estimating the term…
Abstract
An apparatus for processing a substrate is provided. The apparatus includes a processing apparatus and a controller. The processing apparatus includes a chamber. The controller includes a memory and a processor coupled to the memory. The memory stores computer-executable instructions for controlling the processor to control a process of the processing apparatus. The process includes first forming a first film in a first region of the substrate in the chamber by chemical vapor deposition. The process further includes second forming a second film in a second region of the substrate in the chamber by atomic layer deposition. The first forming and the second forming are performed without moving the substrate out of the chamber.
Claims18
An apparatus for processing a substrate, the apparatus comprising:
- at least a first and a second chamber;
- and
- a controller comprising a memory and a processor coupled to the memory, wherein
- the memory stores computer-executable instructions for controlling the processor to perform a process comprising:
- first forming a first film in a first region of the substrate in the first chamber by chemical vapor deposition;
- second forming, by introducing a precursor of material adsorbed with the substrate into the chamber, introducing modifying gas into the chamber, and generating plasma from the modifying gas, a second film in a second region of the substrate in the first chamber;
- and
- etching the substrate in the second chamber, wherein
- the first forming and the second forming are performed without moving the substrate out of the first chamber,
- the first and second chambers are different chambers, and
- the etching performs an atomic layer etching and includes:
- modifying a surface of the substrate by one of N plasma and H plasma, purging the chamber, and
- removing the surface modified by the one of N plasma and the H plasma by halogen gas.
An apparatus for processing a substrate, the apparatus comprising:
- at least a first and a second chamber;
- and
- a controller comprising a memory and a processor coupled to the memory, wherein
- the memory stores computer-executable instructions for controlling the processor to perform a process comprising:
- first forming a first film in a first region of the substrate in the first chamber;
- second forming, by introducing a precursor of material adsorbed with the substrate into the chamber, introducing modifying gas into the chamber, and generating plasma from the modifying gas, a second film in a second region of the substrate in the first chamber;
- and
- etching the substrate in the second chamber, wherein
- the first forming and the second forming are performed without moving the substrate out of the first chamber,
- the first and second chambers are different chambers, and
- the etching includes:
- modifying a surface of the substrate by one of N plasma and H plasma, purging the chamber, and
- removing the surface modified by the one of N plasma and the H plasma by halogen gas.
Dependencies are inferred from the claim text.