Device for detecting a temperature, installation for producing an optical element and method for producing an optical element
AssigneeCarl Zeiss SMT GmbH
InventorsMichael Stolz, Timo Laufer
Life of this patent
Estimating the term…
Loading patent…
AssigneeCarl Zeiss SMT GmbH
InventorsMichael Stolz, Timo Laufer
Estimating the term…
A device (20) for detecting a temperature on a surface (15) of an optical element (14) for semiconductor lithography. The device includes an optical element (14) having a face (16) irradiated with electromagnetic radiation (7, 8, 43), a temperature recording device (21), and a temperature controlled element (22) configured to be temperature-controlled and arranged so that the predominant proportion of the intensity of the thermal radiation (25.2) detected by the temperature recording device and reflected by reflection at the surface of the optical element is emitted by the temperature-controlled element. Also disclosed are an installation (1) for producing a surface (15) of an optical element (14) for semiconductor lithography and a method for producing a surface (15) of an optical element (14) of a projection exposure apparatus (30), wherein the surface is temperature-controlled and the surface temperature is detected during the temperature control.
A device for detecting a temperature on a surface of an optical element for semiconductor lithography, comprising:
A method comprising:
A method comprising:
Dependencies are inferred from the claim text.