Measuring probe with field generating coil configuration and temperature compensation
AssigneeMitutoyo Corporation
InventorsChristopher Richard Hamner, Scott Allen Harsila
Life of this patent
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AssigneeMitutoyo Corporation
InventorsChristopher Richard Hamner, Scott Allen Harsila
Estimating the term…
A measuring probe for a coordinate measuring machine is provided. The measuring probe includes a stylus position detection portion, signal processing and control circuitry and a temperature dependent compensation portion. The stylus position detection portion includes a field generating coil configuration and a sensing coil configuration. The temperature dependent compensation portion includes a temperature dependent component that is coupled to a field generating coil of the field generating coil configuration such that a change in a characteristic of the temperature dependent component due to an increase in temperature of the temperature dependent component causes relatively more current to flow through the field generating coil when driven by the coil drive signal than if the characteristic of the temperature dependent component had not changed. Such implementations are configured to increase the accuracy of the processed signals by at least partially compensating for certain affects that occur due to temperature changes.
A measuring probe for a coordinate measuring machine, the measuring probe comprising:
A method of operating a measuring probe for a coordinate measuring machine,
A system, comprising:
Dependencies are inferred from the claim text.