Protection circuit for high temperature reverse bias test

A method for implementing a protection circuit for protecting an electronic device under a high temperature reverse bias (HTRB) test, comprising:

• connecting a first conduction terminal of a switch to the electronic device;
• connecting an input terminal of a current-sensing circuit to a second conduction terminal of the switch;
• connecting a ground terminal of the current-sensing circuit to a negative terminal of a power supply;
• connecting an input terminal of a driving circuit to an output terminal of the current-sensing circuit;
• connecting a ground terminal of the driving circuit to the negative terminal of the power supply;
• connecting an output terminal of the driving circuit to a control terminal of the switch;
• configuring the switch to connect/disconnect the protection circuit to/from the electronic device based on a switching signal;
• configuring the current-sensing circuit to sense a drain-source leakage current flowing through a drain-source junction of the electronic device and generate a current-sensing signal;
• and
• configuring the driving circuit to receive the current-sensing signal from the current-sensing circuit and generate a driving signal for switching on/off the switch, and when the current-sensing signal is higher than a reference voltage, configuring the driving circuit to transmit the driving signal to the switch to control the switch to disconnect the protection circuit from the electronic device, such that a drain source leakage current is blocked by the switch;
• wherein the switch is a normally-off switch, and the driving circuit is configured by:
• connecting a non-inverting input terminal of a comparator to an input terminal of the driving circuit;
• connecting an inverting input terminal of the comparator to an internal reference voltage;
• connecting a reset terminal of a rising-edge triggered latch to an output terminal of the comparator;
• and connecting an inverted output terminal of the rising-edge triggered latch to the output terminal of the driving circuit;
• or,
• connecting a non-inverting input terminal of a comparator to an internal reference voltage;
• connecting an inverting input terminal of the comparator to an input terminal of the driving circuit;
• connecting a reset terminal of a falling-edge triggered latch to an output terminal of the comparator;
• and connecting an inverted output terminal of the falling-edge triggered latch to the output terminal of the driving circuit.

A protection circuit for protecting an electronic device under a high temperature reverse bias (HTRB) test, the protection circuit comprising:

• a switch configured to connect/disconnect the protection circuit to/from the electronic device based on a switching signal;
• a current-sensing circuit configured to sense a drain-source leakage current flowing through a drain-source junction of the electronic device and generate a current-sensing signal;
• and
• a driving circuit configured to receive the current-sensing signal from the current-sensing circuit and generate a driving signal for switching on/off the switch, and when the current-sensing signal is higher than a reference voltage, the driving circuit is configured to transmit the driving signal to the switch to control the switch to disconnect the protection circuit from the electronic device, such that a drain source leakage current is blocked by the switch;
• wherein:
• the switch has a first conduction terminal connected to the electronic device;
• the current-sensing circuit has an input terminal connected to a second conduction terminal of the switch and a ground terminal connected to a negative terminal of a power supply;
• and
• the driving circuit has an input terminal connected to an output terminal of the current-sensing circuit, a ground terminal connected to the negative terminal of the power supply, and an output terminal connected to a control terminal of the switch;
• wherein the driving circuit comprises:
• a comparator configured to receive the current-sensing signal and compare the current-sensing signal with the reference voltage to generate a comparison output signal;
• an internal reference voltage supply configured to provide the reference voltage to the comparator;
• and
• a latch configured to receive the comparison output signal and generate the driving signal;
• wherein the switch is a normally-on switch;
• wherein the comparator of the driving circuit has a non-inverting input terminal connected to an input terminal of the driving circuit and an inverting input terminal connected to the internal reference voltage supply;
• and the latch of the driving circuit is a rising-edge triggered latch having a reset terminal connected to an output terminal of the comparator and a non-inverting output terminal connected to the output terminal of the driving circuit;
• or
• the comparator of the driving circuit has a non-inverting input terminal connected to the internal reference voltage supply and an inverting input terminal connected to an input terminal of the driving circuit;
• and the latch of the driving circuit is a falling-edge triggered latch having a reset terminal connected to an output terminal of the comparator and a non-inverting output terminal connected to the output terminal of the driving circuit.