Back to results
US 12,315,406 B2Granted
Pixel structure for repairing defects for micro device integrated systems
AssigneeVueReal Inc.
InventorGholamreza Chaji
Life of this patent
Estimating the term…
Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Claims10
A method of extracting and identifying defects in at least one micro device parameter, the method comprising:
- coupling a test substrate to a donor substrate or a system substrate, the test substrate including an electrode and a dielectric, the system substrate including a micro device, the micro device including at least one floating contact, the test substrate and the at least one floating contact forming a test capacitor;
- coupling the test capacitor to a first time varying test signal through the electrode in the test substrate;
- measuring an at least one signal from the micro device;
- and
- extracting the at least one micro device parameter from the at least one signal.
2 more elements
Dependencies are inferred from the claim text.