Digital holography metrology system
AssigneeMitutoyo Corporation
InventorNick Hartmann
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AssigneeMitutoyo Corporation
InventorNick Hartmann
Estimating the term…
A digital holography metrology system is provided including a heterodyne light source, an interferometric optical arrangement and a sensor arrangement. The heterodyne light source provides combined laser beams of different corresponding frequencies and wavelengths (e.g., for which each combined beam may include a corresponding wavelength laser beam and a corresponding frequency shifted laser beam, which may be orthogonally polarized). The interferometric optical arrangement utilizes the combined beams for providing an output for imaging a workpiece, for which the output includes interference beams. The sensor arrangement includes dichroic components which separate the interference beams to be directed to respective time of flight sensors. The outputs from the time of flight sensors are utilized to determine measurements (e.g., the outputs of the time of flight sensors may be utilized to determine a measurement distance to a surface point on a workpiece, etc.).
A digital holography metrology system, comprising:
A method for operating a digital holography metrology system, the method comprising:
A sensor arrangement for use in a digital holography metrology system, wherein the digital holography metrology system comprises:
Dependencies are inferred from the claim text.