Identifying defect sensitive codes for testing devices with input or output code

A non-transitory computer-readable program storage medium having stored thereon program instructions that when executed by a processor have the processor capable of:

• simulating a device under test, the device under test operable to receive a digital code input and output in response a corresponding output;
• injecting a plurality of simulated faults into a pre-silicon model of the device under test;
• for each injected simulated fault:
• inputting a plurality of digital codes to the pre-silicon model of the device under test;
• and
• for each input digital code, selectively storing the input digital code if a difference, between a corresponding output for the input digital code and a no-fault output for the input digital code, exceeds a predetermined threshold value.

A method of operating a computational system to evaluate a device under test, the device under test operable with respect to receive an analog value input and output in response a digital code from among a set of digital codes, the method comprising:

• injecting a plurality of simulated faults into a pre-silicon model of the device under test;
• for each injected simulated fault:
• inputting a plurality of analog values to the pre-silicon model of the device under test;
• and
• for each input analog value, selectively storing a representation of the input value if a difference, between a corresponding digital code output for the input analog value and a no-fault digital code output for the input analog value, exceeds a predetermined threshold value.

A method of operating a computational system to evaluate a device under test, the device operable with respect to a set of digital codes as either a set of device inputs or a set of device outputs, the method comprising:

• fault injection of a plurality of simulated faults into a pre-silicon model of the device under test;
• incremental analysis for each injected simulated fault by:
• inputting a plurality of conditions as inputs to the pre-silicon model of the device under test;
• and
• for each input condition, selectively storing the input condition if a difference, between a corresponding output for the input condition and a no-fault output for the input condition, exceeds a predetermined threshold value.

A non-transitory computer-readable program storage medium having stored thereon program instructions that when executed by a processor have the processor capable of:

• simulating a device under test, the device under test operable to receive an analog value input and output in response a digital code from among a set of digital codes;
• injecting a plurality of simulated faults into a pre-silicon model of the device under test;
• for each injected simulated fault:
• inputting a plurality of analog values to the model;
• and
• for each input analog value, selectively storing a representation of the input value if a difference, between a corresponding digital code output for the input analog value and a no-fault digital code output for the input analog value, exceeds a predetermined threshold value.

A method of operating a computational system to evaluate a device under test, the device operable with respect to a set of digital codes as either a set of device inputs or a set of device outputs, the method comprising:

• inputting a plurality of input conditions into a pre-silicon model of the device under test, each input condition in the plurality of conditions either comprising an input code in the set of digital codes or corresponding to a counterpart output code in the set of digital codes;
• for each input condition in the plurality of input conditions, storing a corresponding no-fault output, from the pre-silicon model of the device under test, for the input condition;
• injecting a plurality of simulated faults into the pre-silicon model of the device under test;
• for each injected simulated fault:
• inputting the plurality of conditions as inputs to the pre-silicon model of the device under test;
• and
• for each input condition in the plurality of conditions, selectively storing the input condition, if an output corresponding to the input condition is different, beyond a threshold, as compared to the no-fault output for the input condition.