Apparatus and methods for determining force applied to the tip of a probe
AssigneeThe University of Sheffield
InventorsDilichukwu Anumba, Timothy James Healey
Life of this patent
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Abstract
An apparatus for determining a force Ftip applied to a tip of an electrical impedance spectroscopy probe includes a load cell, accelerometer, and a processing means. The probe tip has a substantially planar distal end for contacting human or animal tissue. The load cell measures the force Floadcell applied axially along a longitudinal axis when the probe tip is in contact with human or animal tissue. The accelerometer measures a gravity vector Aaxial. The apparatus includes a means for compensating for the mass of the probe tip using the measured force and the gravity vector to produce a calibrated measurement force F applied to the probe tip.
Claims9
An apparatus comprising an elongate probe, said elongate probe being an electrical impedance spectroscopy probe for investigating the electrical conductivity or bioimpedance of cervical tissue, the apparatus capable of determining a force Ftip applied to the tip of said elongate probe, the apparatus comprising:
- a handle;
- said elongate probe comprising said probe tip attached to said handle, wherein the probe tip comprises an EEPROM within the probe tip and wherein a mass of the probe tip is stored on the EEPROM;
- a load cell located in said handle and capable of measuring a force Floadcell applied axially to said probe tip along a longitudinal axis thereof when said probe tip is in contact with said human or animal cervical tissue, wherein said load cell comprises four strain gauges in a bridge configuration, wherein the bridge configuration is excited by bursts of square wave pulses at a frequency of 1 kHz;
- an accelerometer located in the handle for measuring a gravity vector Aaxial, the accelerometer in fixed relationship with the probe tip and the load cell;
- and
- a microcontroller for compensating for the mass of the probe tip using said measured force and gravity vector to produce a calibrated measurement of said force Ftip applied to said probe tip, the microcontroller generating a displayable output for indicating to a user the calibrated measurement of said force Ftip;
- wherein said probe tip is an interchangeable probe tip removably attached to said handle.
Dependencies are inferred from the claim text.