Method for analyzing gas and device for analyzing gas
AssigneePanasonic Holdings Corporation
InventorsYosuke Hanai, Atsuo Nakao, Takeshi Yanagida, Kazuki Nagashima
Life of this patent
Estimating the term…
Loading patent…
AssigneePanasonic Holdings Corporation
InventorsYosuke Hanai, Atsuo Nakao, Takeshi Yanagida, Kazuki Nagashima
Estimating the term…
A method for analyzing a gas includes: allowing a sample gas to be adsorbed by each of a plurality of adsorbents (70) respectively having compositions that are different from each other; allowing the sample gas to be desorbed individually from the adsorbents (70) while detecting individually the sample gas desorbed from each of the adsorbents (70) so as to acquire desorption profiles of the sample gas that are respectively unique to the adsorbents (70); and identifying the sample gas by using a group of the desorption profiles. The acquiring of the desorption profiles is carried out by detecting, individually and over time, the sample gas desorbed from each of the adsorbents (70). Each of the desorption profiles is, for example, an overtime data created from a detection signal reflecting a quantity of the sample gas.
A method for analyzing a gas, comprising:
A device for analyzing a gas, comprising:
Dependencies are inferred from the claim text.