Measuring device having an electrothermal transducer for adjusting a thermal resistance, and method of operating the same
AssigneeAnton Paar GmbH
InventorPhilipp Thaler
Life of this patent
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AssigneeAnton Paar GmbH
InventorPhilipp Thaler
Estimating the term…
A measuring device for thermal analysis of a sample is described, the measuring device comprising: (i) a sample receptacle for receiving the sample, (ii) a heating device for increasing the temperature of the sample receptacle, (iii) a cooling device for reducing the temperature of the sample receptacle, and (iv) a heat transport element having a thermal resistance and being arranged between the heating device and the cooling device such that a heat flow between the heating device and the cooling device via the heat transport element is enabled. Further, the measuring device v) comprises an electrothermal transducer arranged between the heat transport element and the cooling device such that operating the electrothermal transducer adjusts the heat flow through the heat transport element.
A measuring device for thermal analysis of a sample, the measuring device comprising:
A method of operating a measuring device for thermal analysis comprising a sample receptacle with two sample containers, a heating device and a cooling device coupled together by a heat transport element via a heat flow, the method comprising:
Dependencies are inferred from the claim text.