Sample measurement device and measurement parameter setting assistance device
AssigneeShimadzu Corporation
InventorAkira Noda
Life of this patent
Estimating the term…
Abstract
A sample measurement device includes a measurement unit (1) configured to measure a sample, and a controller (2) configured to analyze a measurement result of the measurement unit. The controller (2) is configured to estimate and acquire a measurement result under another measurement condition using a model formula based on measurement results under a plurality of measurement conditions with different measurement parameter conditions, and estimate a distribution of a measurement quality indicator with respect to a measurement parameter based on the estimated measurement result.
Claims10
A sample measurement device comprising:
- a measurement unit configured to measure a sample;
- and
- a controller configured to analyze a measurement result of the measurement unit;
- wherein
- the controller is configured to estimate and acquire a measurement result under another measurement condition using a model formula based on measurement results under a plurality of measurement conditions with different measurement parameter conditions, and estimate a distribution of a measurement quality indicator with respect to a measurement parameter based on the estimated measurement result,
- wherein the controller is configured to calculate a range of the measurement parameter according to an allowable range of the measurement quality indicator based on the distribution of the measurement quality indicator, and
- wherein the controller is configured to adjust the measurement parameter based on the calculated range or display the calculated range.
A measurement parameter setting assistance device comprising:
- an arithmetic device configured to estimate and acquire a measurement result under another measurement condition using a model formula based on measurement results under a plurality of measurement conditions with different measurement parameter conditions for measuring a sample, the arithmetic device being configured to estimate a distribution of a measurement quality indicator with respect to a measurement parameter based on the estimated measurement result,
- wherein the arithmetic device is configured to calculate a range of the measurement parameter according to an allowable range of the measurement quality indicator based on the distribution of the measurement quality indicator, and
- wherein the arithmetic device is configured to adjust the measurement parameter based on the calculated range or display the calculated range.
Dependencies are inferred from the claim text.