An aluminum nitride AlN, aluminum gallium nitride AlGaN, or gallium nitride GaN-based wide bandgap optoelectronic device, comprising:
- an epitaxial substrate having a two-dimensional 2D material interposer, the epitaxial substrate extending along an epitaxial interface direction, comprising:
- a polycrystalline base substrate having a superficial layer, a wafer bevel, and a back surface, wherein a difference in coefficient of thermal expansion between the polycrystalline base substrate and AlN or GaN is not greater than 1.5×10−6° C.−1 in a direction parallel to the epitaxial interface;
- a multi-orientation 2D ultra-thin material interposer arranged on the superficial layer of the polycrystalline base substrate, wherein the multi-orientation 2D ultra-thin material interposer has a top layer, a lattice constant of the top layer being highly matched with that of AlN, AlGaN, or GaN;
- and
- an AlN, AlGaN, or GaN-based epitaxial layer, which is epitaxially grown on a portion of the multi-orientation 2D ultra-thin material interposer distant from the polycrystalline base substrate, to serve as an active layer;
- at least a pair of actuating electrodes which actuate the epitaxial substrate;
- and
- an encapsulation layer which encapsulates the epitaxial substrate.