Method to locate defects in e-coat
AssigneeInovision Software Solutions, Inc.
InventorJacob Nathaniel Allen
Life of this patent
Estimating the term…
Abstract
A method of locating a defect in an e-coat on a surface can include acquiring an image of the surface. A correction coefficient can be applied to the image to form an adjusted image. The correction coefficient can relate pixel values of the image to a calibration value. The adjusted image can be separated into a spectral component which can be modified by a block average determination to create a modified spectral component. The spectral components can be compared with the modified spectral components to form a difference image. The difference image can be dilated and eroded. A region of interest can be identified from an image region using a blob detection. The defect can be classified as a defect type. The defect can be repaired or a coding parameter can be altered based on the defect.
Claims19
A method of locating a defect in an e-coat on a surface, comprising:
- acquiring an image of the surface;
- applying a correction coefficient to the image to form an adjusted image, the correction coefficient relating pixel values of the image to a calibration value;
- separating a spectral component from the adjusted image each of the plurality of pixels;
- modifying the spectral component to create a modified spectral component, the modifying including a block average determination;
- comparing the spectral component with the modified spectral component to form a difference image;
- dilating and eroding the difference image;
- identifying a region of interest from a one or more image regions using a blob detection threshold value to locate the defect;
- classifying the defect;
- and
- performing one of:
- repairing the defect;
- and
- changing a parameter of an e-coating process to form a modified e-coating process and coating another surface using the modified e-coating process.
Dependencies are inferred from the claim text.