Magnetoresistance effect element, magnetic recording element, and high-frequency device
AssigneeTDK Corporation
InventorsShinto Ichikawa, Kazuumi Inubushi, Katsuyuki Nakada
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AssigneeTDK Corporation
InventorsShinto Ichikawa, Kazuumi Inubushi, Katsuyuki Nakada
Estimating the term…
A magnetoresistance effect element having a large MR ratio is provided. This magnetoresistance effect element includes: a first ferromagnetic layer; a second ferromagnetic layer; and a nonmagnetic layer. The first ferromagnetic layer includes a first layer and a second layer. The first layer is closer to the nonmagnetic layer than the second layer. The first layer has a Heusler alloy containing at least partially crystallized Co. The second layer contains a material different from the Heusler alloy and has at least a partially crystallized ferromagnetic material. The first layer and the second layer have added first atoms. The first atom is any one selected from the group consisting of Mg, Al, Cr, Mn, Ni, Cu, Zn, Pd, Cd, In, Sn, Sb, Pt, Au, and Bi.
A magnetoresistance effect element comprising:
Dependencies are inferred from the claim text.