Method for manufacturing a flux detector of a first and a second ionizing radiation

A method for measuring flows of incident ionizing radiation, said method comprising a step of measuring, using the same detector, flows of multiple incident ionizing radiation levels successively emitted one after the other, with the median energies of the ionizing particles of these incident ionizing radiation levels to be measured varying between a minimum value and a maximum value, with the minimum and maximum values being spaced apart by at least 500 keV;

• wherein the detector used to measure the flows of these incident ionizing radiation levels comprises:
• a single stack containing, in a direction of propagation of the incident ionizing radiation, a total thickness eT of amplifying material and a thickness of a transducing material traversed by the incident ionizing radiation to be measured,
• with the thickness of transducing material being able to generate photons or electrical charges when it is excited by a lower energy secondary ionizing radiation than the energy of the incident ionizing radiation to be measured that is currently emitted,
• with the total thickness of amplifying material being able to generate this lower energy secondary ionizing radiation when it is excited by the incident ionizing radiation to be measured that is currently emitted, this total thickness eT being greater than 15 μm;
• and
• a sensor for photons or electrical charges connected to the stack for counting the number of photons or electrical charges generated per second by the thickness of transducing material,
• wherein the total thickness eT of amplifying material of the detector used to measure the flows of these incident ionizing radiation levels ranges between 0.9 em and 1.1 em, where the thickness em is the total thickness of amplifying material for which the numbers of photons or electrical charges generated per second by the thickness of transducing material when the stack is irradiated by first and second incident ionizing radiation, respectively, are equal,
• with this first and second incident ionizing radiation being equal to the ionizing radiation for which the median energies of the ionizing particles are equal to said minimum and maximum values, respectively, implemented during the measurement step.

A detector for detecting the flows of a first and a second incident ionizing radiation that differ from each other only by the fact that the median energies of the ionizing particles in the first and second incident ionizing radiation are equal to a first and a second value, respectively, with the first and second values being selected from the group made up of:

• a first value equal to 100 keV and a second value equal to 600 keV;
• a first value equal to 2 MeV and a second value equal to 4.5 MeV;
• a first value equal to 500 keV and a second value equal to 10 MeV;
• a first value equal to 25 MeV and a second value equal to 50 MeV;
• and
• a first value equal to 230 MeV and of a second value equal to 250 MeV;
• said detector comprising:
• a single stack containing, in a direction of propagation of the first and second incident ionizing radiation, a total thickness eT of amplifying material and a thickness of a transducing material traversed by the first and second incident ionizing radiation to be measured,
• with the thickness of transducing material being able to generate photons or electrical charges when it is excited by lower energy secondary ionizing radiation than the energy of the first and second incident ionizing radiation,
• with the total thickness of amplifying material being able to generate this lower energy secondary ionizing radiation when it is excited by the first and second incident ionizing radiation, this total thickness eT being greater than 15 μm;
• and
• a sensor for photons or electrical charges connected to the stack for counting the number of photons or electrical charges generated per second by the thickness of transducing material,
• wherein the total thickness of amplifying material ranges between 0.9 em and 1.1 em, where the thickness em is the total thickness of amplifying material for which the numbers of photons or electrical charges generated per second by the thickness of transducing material when the stack is irradiated by the first and second incident ionizing radiation, respectively, are equal.