Instrument, including an electrostatic linear ion trap, for analyzing ions
AssigneeThe Trustees of Indiana University
InventorsMartin F. Jarrold, Joanna A. Hogan
Life of this patent
Estimating the term…
Loading patent…
AssigneeThe Trustees of Indiana University
InventorsMartin F. Jarrold, Joanna A. Hogan
Estimating the term…
An instrument for analyzing ions may include an ion source to generate ions, at least one ion processing instrument to process the generated ions by one or both of filtering the ions according to a molecular characteristic and dissociating the ions, and an electrostatic linear ion trap (ELIT) to receive and trap ions exiting the at least one ion processing instrument. The ELIT has first and second ion mirrors separated by a charge detection cylinder, and is configured such that trapped ions oscillate back and forth through the charge detection cylinder between the first and second ion mirrors with a duty cycle, corresponding to a ratio of time spent by the trapped ions traversing the charge detection cylinder and total time spent by the trapped ions traversing a combination of the first and second ion mirrors and the charge detection cylinder during one complete oscillation cycle, of approximately 50%.
An instrument for analyzing ions, comprising:
An instrument for analyzing ions, comprising:
A method for analyzing ions, comprising:
Dependencies are inferred from the claim text.