Ion source
AssigneeBeam Alpha, Inc.
InventorGerald Peter Jackson
Life of this patent
Estimating the term…
Abstract
A machine, article, process of using, process of making, products produced thereby and necessary intermediates. Illustratively, there can be a process that includes: ionizing at least some injected gas to form ions; confining, without using magnetic fields, at least some of said ions to produce confined ions; accumulating at least some of said confined ions to produce accumulated ions; cooling at least some of said accumulated ions to produce cooled ions; compressing, without using magnetic fields, at least some of said accumulated ions to produce compressed ions; accelerating at least some of said compressed ions to produce accelerated ions; ejecting at least some of said accelerated ions; and measuring at least one property of said ejected ions.
Claims20
A method comprising:
- ionizing at least some injected gas to form ions;
- confining, without using magnetic fields, at least some of said ions to produce confined ions;
- accumulating at least some of said confined ions to produce accumulated ions;
- reducing emittance of at least some of said accumulated ions to produce cooled ions;
- compressing, via longitudinal phase space rotation, without using magnetic fields, at least some of said accumulated ions to produce compressed ions;
- accelerating at least some of said compressed ions to produce accelerated ions;
- ejecting at least some of said accelerated ions to form ejected ions;
- and
- measuring at least one property of said ejected ions.
An apparatus comprising:
- a gas injection system configured to accept injected gas;
- a gas ionizer assembly configured to ionize at least some of said injected gas and thereby form ions;
- an ion confinement assembly, configured to confine, without using magnetic fields, at least some of said ions to produce confined ions;
- an ion accumulation assembly, configured to accumulate at least some of said confined ions to produce accumulated ions;
- an ion emittance reducing assembly, configured to cool at least some of said accumulated ions to produce cooled ions;
- an ion compression assembly, configured to compress, via longitudinal phase space rotation, without using magnetic fields, at least some of said accumulated ions to produce compressed ions;
- an ion acceleration assembly, configured to accelerate at least some of said compressed ions to produce accelerated ions;
- an ion ejection assembly, configured to eject at least some of said accelerated ions to produce ejected ions;
- and
- ion beam instrumentation, measuring at least one property of said ejected ions.
Dependencies are inferred from the claim text.