US 12,266,394 B2 · Robust functionality for memory management associated with high-temperature storage and other conditions

Abstract

Methods, systems, and devices for robust functionality for memory management associated with high-temperature storage are described. A memory device may apply a pattern (e.g., an imprint conditioning or deletion pattern) to at least a portion of memory cells of a memory array associated with a memory device before or after a power state procedure. The memory device may determine the pattern from various possible patterns, where the pattern may indicate a data state for each memory cell of the portion of memory cells. The pattern may indicate a same data state for each memory cell, an alternating data state for each memory cell, or an asymmetric switching pattern over a plurality of cycles, or any combination thereof. The memory device may write a respective logic value to at least some of the one or more memory cells of the portion of memory cells according to the pattern.

Claims25

Dependent claims

A method, comprising:

determining to perform an imprint conditioning procedure on one or more memory cells of a memory array of a memory device based at least in part on an indication of a power down of the memory device;
writing a respective logic value to at least one of the one or more memory cells in accordance with an imprint conditioning pattern based at least in part on determining to perform the imprint conditioning procedure;
and
performing the power down of the memory device based at least in part on the indication of the power down and writing the respective logic value to the at least one of the one or more memory cells.

1 more element

An apparatus, comprising:

a memory array;
and
a controller coupled with the memory array and operable to cause the apparatus to:
determine to perform an imprint conditioning procedure on one or more memory cells of the memory array of a memory device based at least in part on an indication of a power state procedure of the memory device;
and
write a respective logic value to at least one of the one or more memory cells in accordance with an imprint conditioning pattern based at least in part on determining to perform the imprint conditioning procedure.

3 more elements

Dependencies are inferred from the claim text.

Robust functionality for memory management associated with high-temperature storage and other conditions

Life of this patent

Robust functionality for memory management associated with high-temperature storage and other conditions

Life of this patent

Abstract

Claims25