Measuring system, measuring device, and measuring method
AssigneeTokyo Electron Limited
InventorsTakayuki Hatanaka, Kimihiro Yokoyama, Norihiko Amikura
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AssigneeTokyo Electron Limited
InventorsTakayuki Hatanaka, Kimihiro Yokoyama, Norihiko Amikura
Estimating the term…
A measuring system according to an exemplary embodiment acquires a measurement value indicating electrostatic capacitance between a measuring device and a transport fork for transporting the measuring device. The transport fork includes a target electrode. The measuring device includes a first sensor provided on a base board. The first sensor includes a central electrode and peripheral electrodes. The central electrode acquires electrostatic capacitance for reflecting a distance with the target electrode. The peripheral electrodes are disposed around the central electrode to acquire electrostatic capacitance for reflecting an amount of deviation in a horizontal direction with respect to the target electrode of the transport fork.
A measuring system that acquires a measurement value indicating electrostatic capacitance between a measuring device and a first object for transporting the measuring device,
A measuring device that acquires a measurement value indicating electrostatic capacitance between the measuring device and an object,
A measuring method for acquiring a measurement value indicating electrostatic capacitance between a measuring device and an object,
Dependencies are inferred from the claim text.