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US 12,261,032 B2Granted
Low-power mass interrogation system and assay for determining vitamin D levels
AssigneeLeidos, Inc.
InventorNoah Peter Christian
Life of this patent
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Abstract
A low power mass spectrometer assembly includes at least an ionization component, an electrostatic analyzer, a lens assembly, a magnet assembly and at least one detector located in a same plane as the entrance to the magnet assembly for detecting the deflected sample ions and/or fragments of sample ions, including ions or ion fragments indicative of the Vitamin D metabolite within the sample.
Claims15
A mass spectrometer assembly for performing tandem mass spectrometry, comprising:
- an ionization component for producing sample ions from a sample;
- an electrostatic analyzer for receiving the sample ions from the ionization component and producing a preferred set of sample ions;
- a lens assembly for receiving the preferred set of sample ions from the electrostatic analyzer and focusing the preferred sample set of ions;
- a magnet assembly for receiving the focused preferred sample set of ions at an entrance thereof and deflecting sample ions within the focused preferred sample set of ions using zero power to a first detector located in a same plane as the entrance to the magnet assembly for detecting the deflected sample ions, wherein individual sample ions are deflected to different points along the first detector in accordance with an individual mass thereof;
- and
- an ion fragmentation component located in a region of the first detector, wherein the ion fragmentation component fragments one or more individual sample ions received at the first detector into fragments and the fragments are deflected to a second detector located in the plane of the first detector array.
3 more elements
A process for performing tandem mass spectrometry, comprising:
- producing, by an ionization component, sample ions from a sample;
- receiving by an electrostatic analyzer, the sample ions from the ionization component and producing a preferred set of sample ions;
- receiving by a lens assembly, the preferred set of sample ions from the electrostatic analyzer and focusing the preferred sample set of ions;
- receiving, at an entrance of a magnet assembly, the focused preferred sample set of ions and deflecting sample ions within the focused preferred sample set of ions using zero power to a first detector located in a same plane as the entrance to the magnet assembly;
- detecting the deflected sample ions, at a first detector, wherein individual sample ions are deflected to different points along the first detector in accordance with an individual mass thereof;
- fragmenting, by an ion fragmentation component located in a region of the first detector, one or more individual sample ions received at the region of the first detector into fragments and deflecting the fragments, by the magnet assembly, to a second detector located in the plane of the first detector array;
- and
- detecting, by the second detector, the fragments, wherein fragment detection enables identification of individual components within the sample.
5 more elements
Dependencies are inferred from the claim text.