Methodology and instrumentation for thin film mechanical analysis

A thin film tensile instrument for analyzing thin film mechanical properties, the instrument comprising:

• an electronic control linear stage for controlling the force applied to a thin film;
• a load cell unit for determining the force applied to the thin film;
• at least two sample grips for securing the thin film, each of the at least two sample grips including a thin adhesive layer configured to adhere to the thin film, wherein the grips are positioned on opposite sides of the thin film;
• a first and a second L-shaped arm for mounting the thin film to be analyzed;
• a first vertical stage for mounting the first L-shaped arm and the linear stage and a second vertical stage for mounting the second L-shaped arm and the load cell unit;
• a fluid support for the thin film, wherein the support includes a liquid bath holding a liquid and the first and second L-shaped arms are configured to position the thin film on a surface of the liquid held by the liquid bath;
• a temperature stage to control a temperature of the liquid of the liquid bath;
• and
• a motor to move the linear stage and the thin film.