Systems and methods for structurally characterizing compounds
AssigneesThe Regents of the University of California, California Institute of Technology
InventorsHosea M. Nelson, Jose A. Rodriguez, Brian M. Stoltz, Tamir Gonen, Michael Martynowycz
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Abstract
The present disclosure provides methods of collecting electron diffraction patterns from nanocrystals to obtain a three-dimensional structural model of a compound, as well as methods of identifying compounds and methods of determining polymorphic forms. In addition, the present disclosure provides methods of characterizing a first compound from a sample, as well as methods of screening compounds from a sample. The present disclosure also provides systems for characterizing a compound from a sample, which systems include modules for high-performance liquid chromatography, dispensing, and electron microscopy.
Claims21
A method of collecting electron diffraction patterns for obtaining a three-dimensional structural model of a compound, the method comprising
- applying a sample comprising the compound to an electron microscopy grid;
- positioning the grid in an electron microscope to place a nanocrystal of the compound in a path of accelerated electrons, wherein the nanocrystal comprises a three-dimensional ordered array of molecules of the compound;
- and
- recording a plurality of electron diffraction patterns from the nanocrystal by orienting the grid in the electron microscope to place the nanocrystal in varied orientations with respect to the path of the accelerated electrons;
- wherein:
- the compound has a molecular mass greater than 100 Daltons and less than 2000 Daltons;
- or
- the method further comprises determining reflection parameters including Miller indices and reflection intensities for a set of spots on the plurality of electron diffraction patterns and determining unit-cell parameters and a space group for the nanocrystal based on the reflection parameters.
Dependencies are inferred from the claim text.