Nondestructive inspecting device, and nondestructive inspecting method
AssigneeRiken
InventorsKunihiro Fujita, Chihiro Iwamoto, Takaoki Takanashi, Yoshie Otake
Life of this patent
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AssigneeRiken
InventorsKunihiro Fujita, Chihiro Iwamoto, Takaoki Takanashi, Yoshie Otake
Estimating the term…
A nondestructive inspecting device (10) includes a neutron emission device (2) that emits a neutron beam to a local irradiation location on a surface (la) of an inspection target (1), a detection device (3) that detects, at each of inspection positions facing the surface (la), scattered neutrons returned from the inspection target (1) as a result of emission of the neutron beam to the irradiation location, and measures the detected number of the scattered neutrons at each of the detection positions, and a ratio calculation unit (5) that calculates, for each of the detection positions, a ratio of the detected number at the detection position to a reference value for the detection position, and outputs the ratios. The reference value is set as the detected number at each of the detection positions in an assumed case of no defects existing in the inspection target (1).
A non-destructive inspecting device comprising:
A non-destructive inspecting method comprising:
Dependencies are inferred from the claim text.