Error rate measurement apparatus and error rate measurement method
AssigneeAnritsu Corporation
InventorHiroyuki Onuma
Life of this patent
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Abstract
An error rate measurement apparatus includes an operation display unit and a display control unit. Displays a measurement result when the matrix scan function is executed. The display control unit displays a first coefficient value in a selectable manner by tabs of a number corresponding to the Full Swing value, uses each one of combinations of the first coefficient value, each second coefficient value, and each third coefficient value on the selected table as the cell, displays an error count value and the bit error rate for each cell, which are obtained by the matrix scan function on a display screen in a matrix, and identifies and displays the bit error rate for each cell on the display screen according to an error degree.
Claims6
An error rate measurement apparatus that executes a matrix scan function for measuring a bit error rate by transmitting a test signal by a combination of coefficient values in a Full Swing value defined by a PCI Express standard to a device under test (W) during link training, and receiving a measurement target signal returned back from the device under test in response to transmission of the test signal, wherein
- the test signal is based on a parameter value of a cell as a scanning target selected and set from a triangular matrix by the combination of the coefficient values,
- three types of coefficient values are provided in the Full Swing value, and
- the error rate measurement apparatus comprises:
- a display control unit that displays a first coefficient value in a selectable manner by tabs of a number corresponding to the Full Swing value, uses each one of combinations of the first coefficient value, each second coefficient value, and each third coefficient value on the selected tab as the cell, displays an error count value and the bit error rate for each cell, which are obtained by the matrix scan function on a display screen in a matrix, and identifies and displays the bit error rate for each cell on the display screen, according to an error degree.
An error rate measurement method for executing a matrix scan function for measuring a bit error rate by transmitting a test signal by a combination of coefficient values in a Full Swing value defined by a PCI Express standard to a device under test (W) during link training, and receiving a measurement target signal returned back from the device under test in response to transmission of the test signal, wherein
- the test signal is based on a parameter value of a cell as a scanning target selected and set from a triangular matrix by the combination of the coefficient values,
- three types of coefficient values are provided in the Full Swing value, and
- the error rate measurement method comprises:
- a step of displaying a first coefficient value in a selectable manner by tabs of a number corresponding to the Full Swing value;
- a step of using each one of combinations of the first coefficient value, each second coefficient value, and each third coefficient value on the selected tab as the cell, and displaying an error count value and the bit error rate for each cell, which are obtained by the matrix scan function on a display screen in a matrix;
- and
- a step of identifying and displaying the bit error rate for each cell on the display screen, according to an error degree.
Dependencies are inferred from the claim text.