Methods and systems for manufacturing semiconductor devices
AssigneePsiquantum, Corp.
InventorsFaraz Najafi, Chia-Jung Chung
Life of this patent
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Abstract
The various embodiments described herein include methods for manufacturing superconductor devices. A method for manufacturing superconductors may include: (i) generating spectra data from a first superconductor device; (iii) identifying a first peak ratio between a first phase peak and a second phase peak in the spectra data; (iv) generating additional spectra data from a second superconductor device; (v) identifying a second peak ratio of the additional spectra data from the second superconductor device; (vi) adjusting a manufacturing parameter based on the first peak ratio and the second peak ratio; and (vii) manufacturing a third superconductor device based on the adjusted manufacturing parameter.
Claims14
A method of manufacturing, comprising:
- manufacturing a first superconductor device;
- generating x-ray diffraction spectra data from the first superconductor device;
- identifying a first peak ratio between a first phase peak and a second phase peak in the x-ray diffraction spectra data;
- generating additional x-ray diffraction spectra data from a second superconductor device;
- identifying a second peak ratio of the additional x-ray diffraction spectra data from the second superconductor device;
- adjusting a manufacturing parameter based on the first peak ratio and the second peak ratio;
- and
- manufacturing a third superconductor device based on the adjusted manufacturing parameter.
Dependencies are inferred from the claim text.