Physical property measurement method, physical property measurement device, and probe
AssigneeFUJIFILM Corporation
InventorsTadashi Kajiya, Daisuke Sawai, Koji Miyata, Hiroyuki Noda
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Abstract
Provided are a physical property measurement method, a physical property measurement device, and a probe that can simply measure physical properties of a surface layer portion of an object. A physical property measurement method includes a step of bringing a probe into contact with a surface layer portion of a liquid or gel-like object and maintaining a contact state, a step of measuring a height of the object rising along the probe in contact with the object, and a step of calculating viscous properties or elastic properties of the surface layer portion of the object using the measured height of the object rising along the probe.
Claims11
A physical property measurement method comprising:
- a step of bringing a probe into contact with a surface layer portion of a liquid or gel-like object and maintaining a contact state;
- a step of measuring a height of the object rising along the probe in contact with the object;
- and
- a step of calculating a viscosity or an elastic property of the surface layer portion of the object using the measured height of the object rising along the probe and based on one of the following expressions:
- σ
- ·
- 2
-
- π
-
- R
- ≈
- G
- ·
- h
- R
- ·
- π
-
- R
- 2
-
- and
-
- η
- ≈
- σ
-
- R
- 2
- h
- 2
-
- k
-
- t
- ,
- where σ represents a surface tension of the object, G represents a shear modulus of the surface layer portion of the object, R represents a diameter of a tip portion of the probe at the height of the object rising along the probe, h represents the height of the object as measured, κ represents a meniscus curvature of the surface layer portion of the object, η represents the viscosity, and t represents time in seconds.
A physical property measurement device that measures a viscosity or an elastic property of a surface layer portion of a liquid or gel-like object, the physical property measurement device comprising:
- a stage on which the object is placed;
- a probe that is configured to come into contact with the surface layer portion of the object;
- a driving unit that is configured to bring the probe into contact with the surface layer portion of the object and maintain a contact state, or separates the probe from the surface layer portion;
- a measurement unit that is configured to measure a height of the object rising along the probe in contact with the object;
- and
- a calculation unit that is configured to calculate the viscosity or the elastic property of the surface layer portion of the object using the height of the object rising along the probe measured by the measurement unit and based on one of the following expressions:
- σ
- ·
- 2
-
- π
-
- R
- ≈
- G
- ·
- h
- R
- ·
- π
-
- R
- 2
-
- and
-
- η
- ≈
- σ
-
- R
- 2
- h
- 2
-
- k
-
- t
- ,
- where σ represents a surface tension of the object, G represents a shear modulus of the surface layer portion of the object, R represents a diameter of a tip portion of the probe at the height of the object rising along the probe, h represents the height of the object as measured, κ represents a meniscus curvature of the surface layer portion of the object, η represents the viscosity, and t represents time in seconds,
- wherein the tip portion of the probe has a part whose diameter is equal to or less than 33 μm.
Dependencies are inferred from the claim text.