Micromechanical component for a sensor device
AssigneeRobert Bosch GmbH
InventorJochen Reinmuth
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AssigneeRobert Bosch GmbH
InventorJochen Reinmuth
Estimating the term…
A micromechanical component for a sensor device, including a seismic mass, which is situated at and/or in a mounting and which includes a first electrode area, a second electrode area electrically insulated from the first electrode area, and a connecting area made up of at least one electrically insulating material. The first electrode area and the second electrode area each mechanically contact the connecting area and are connected to one another via the connecting area. At least one first conductive area of the first electrode area and a second conductive area of the second electrode area are structured out of a first semiconductor and/or metal layer. The first electrode area also includes a third conductive area. The second electrode area also includes a fourth conductive area. The third conductive area and the fourth conductive area are structured out of a second semiconductor and/or metal layer.
A micromechanical component for a sensor device, comprising:
A micromechanical component for a sensor device, the micromechanical component comprising:
A manufacturing method for a micromechanical component for a sensor device, the micromechanical component including a mounting, a seismic mass that (a) is situated at and/or in the mounting, (b) is deformable and/or displaceable relative to the mount, and (c) includes a first electrode area, a second electrode area that is electrically insulated from the first electrode area, and a connecting area that is made up of at least one electrically insulating material, is in mechanical contact with each of the first electrode area and the second electrode area, and connects the first and second electrode areas to each other, wherein the first electrode area includes a first conductive area structured out of a first semiconductor and/or metal layer, wherein the second electrode area includes a second conductive area structured out of the first semiconductor and/or metal layer, wherein the first electrode area additionally includes a third conductive area that is in mechanical contact with the first conductive area and that is structured out of a second semiconductor and/or metal layer, wherein the second electrode area additionally includes a fourth conductive area that is in mechanical contact with the second conductive area and that is structured out of the second semiconductor and/or metal layer, and wherein the connecting area is arranged partly over at least a part of the first conductive area, between the first and third conductive areas, and partly over at least a part of the second conductive area, between the second and fourth conductive areas, the method comprising the following steps:
Dependencies are inferred from the claim text.