Apparatuses and methods for calibrating adjustable impedances of a semiconductor device
OwnerDean Gansinventor
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Abstract
Apparatuses and methods for calibrating adjustable impedances of a semiconductor device are disclosed in the present application. An example apparatus includes a register configured to store impedance calibration information and further includes programmable termination resistances having a programmable impedance. The example apparatus further includes an impedance calibration circuit configured to perform a calibration operation to determine calibration parameters for setting the programmable impedance of the programmable termination resistances. The impedance calibration circuit is further configured to program the impedance calibration information in the register related to the calibration operation.
Claims20
A method comprising:
- performing a ZQ calibration operation to determine calibration parameters for output driver impedance;
- setting a value in a mode register when the calibration parameters comprise new calibration parameters;
- receiving a latch command;
- and
- applying the calibration parameters responsive to the latch command.
An apparatus comprising:
- a mode register;
- programmable termination resistances having a programmable impedance;
- and
- an impedance calibration circuit coupled to the calibration terminal and configured to perform a ZQ calibration operation to determine calibration parameters for the programmable termination resistances,
- wherein the impedance calibration circuit is further configured to set a value in the mode register when the calibration parameters comprise new calibration parameters, and
- wherein the impedance calibration circuit is further configured to apply the calibration parameters responsive to a latch command.
Dependencies are inferred from the claim text.