Inspection apparatus and inspection method for display device
AssigneeSamsung Display Co., Ltd.
InventorsSangjun Seok, Namhyuk Kim
Life of this patent
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Abstract
An embodiment provides an inspection apparatus for a display device, including: a light supplier that supplies light to a surface of the display device; an inspection pattern portion positioned between the display device and the light supplier; a measurement portion that measures reflected light reflected from the surface of the display device; and a processor that processes data of the reflected light measured by the measurement portion, wherein the processor includes a calibration data portion including calibration data and a calibrator calibrating the data using the calibration data of the calibration data portion.
Claims11
An inspection apparatus for a display device, comprising:
- a light supplier that supplies light to a surface of the display device;
- an inspection pattern portion between the display device and the light supplier;
- a measurement portion that measures reflected light reflected from the surface of the display device;
- and
- a processing portion that processes data of the reflected light measured by the measurement portion, wherein
- the processing portion includes:
- a processor;
- a calibration data portion including calibration data;
- and
- a calibrator calibrating the data by using the calibration data of the calibration data portion,
- the measurement portion includes a camera that detects the reflected light, and
- the inspection pattern portion includes:
- light-blocking portions arranged to have an interval;
- and
- light-transmitting portions positioned between adjacent ones of the light-blocking portions.
Dependencies are inferred from the claim text.