Electron beam irradiation apparatus with overlapping beam columns and helping columns
AssigneeEbara Corporation
InventorRyo Tajima
Life of this patent
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AssigneeEbara Corporation
InventorRyo Tajima
Estimating the term…
A electron beam irradiation apparatus 1 includes a helping column determination unit 11 that determines, as a helping column, a column having a main irradiation area that is not included in a target irradiation area to be irradiated with an electron beam from among a plurality of columns 2 when information on the target irradiation area is input, and a helped column determination unit 12 that determines, as a helped column for the determined helping column, a column that is adjacent to the helping column and has a main irradiation area included in the target irradiation area from among the plurality of columns 2. A beam scanner 5 of the helping column performs a helping irradiation control for performing electron beam irradiation in the sub-irradiation area of the helping column, thereby irradiating the target irradiation area of the helped column with an electron beam.
A multi-column electron beam irradiation apparatus comprising:
A controlling method for a multi-column electron beam irradiation apparatus in which a plurality of columns is arranged to be adjacent to each other,
A control program executed in a multi-column electron beam irradiation apparatus in which a plurality of columns is arranged to be adjacent to each other,
Dependencies are inferred from the claim text.