Voltage output test circuit, voltage divider output circuit, and memory
AssigneeChangxin Memory Technologies, Inc.
InventorsChan Chen, Anping Qiu
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AssigneeChangxin Memory Technologies, Inc.
InventorsChan Chen, Anping Qiu
Estimating the term…
Embodiments of this invention provide a voltage output test circuit, a voltage divider output circuit, and a memory. The voltage output test circuit includes: a first voltage divider unit, including a first terminal and a second terminal, where the first terminal of the first voltage divider unit is connected to a test power supply, and the second terminal of the first voltage divider unit is connected to an output terminal; a second voltage divider unit, including a first terminal and a second terminal, where the first terminal of the second voltage divider unit is connected to a ground, and the second terminal of the second voltage divider unit is electrically connected to the output terminal; and a third voltage divider unit, configured to adjust a resistance between the output terminal and the ground.
A voltage output test circuit, comprising:
A voltage output test circuit, comprising:
Dependencies are inferred from the claim text.