Circuit interrupt device fault duration monitor
AssigneeSchneider Electric USA, Inc.
InventorsCollin Richard Fischels, Juan Ignacio Melecio Ramirez, Adrian Abdala Rendon Hernandez, Kenneth Riehl
Life of this patent
Estimating the term…
Loading patent…
AssigneeSchneider Electric USA, Inc.
InventorsCollin Richard Fischels, Juan Ignacio Melecio Ramirez, Adrian Abdala Rendon Hernandez, Kenneth Riehl
Estimating the term…
Methods/systems for monitoring fault duration in circuit interrupt devices perform edge detection using a second time derivative of a current or voltage waveform. The second derivative reveals peaks that may be used to establish starting and ending times for the fault duration. In some embodiments, the second derivatives are derived only for portions of the waveform within time windows that enclose the fault duration starting and ending times, respectively. The above arrangement provides a consistent way of determining durations of transitory events, such as durations of faults, and the like, that does not rely on waveform zero-crossings. The duration determinations may be implemented locally within a device, and/or the device may acquire and transfer underlying waveform data to an external system for the duration determinations. Data from multiple devices may be collected over time for analysis and modeling to provide remote support and monitoring of local devices via digital twins.
A circuit interrupt protective device, comprising:
A method of determining a duration of a fault event in a circuit interrupt protective device, the method comprising:
A non-transitory computer-readable medium having computer-readable instructions stored thereon for determining a duration of a fault event in a circuit interrupt protective device, the computer-readable instructions, when executed by a processor, cause the processor to perform a process that:
Dependencies are inferred from the claim text.