# US 12,224,732 B2 · Solidly-mounted transversely-excited film bulk acoustic resonators and filters for 27 GHz communications bands > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,224,732 B2 - Document ID: US12224732B2 - Status: Granted - Kind: B2 - Application number: 17/558,090 - Filed: 2021-12-21 - Published: 2022-04-14 - Granted: 2025-02-11 - Earliest claimed: 2018-06-15 - Assignees: Murata Manufacturing Co., Ltd. - Applicants: Murata Manufacturing Co., Ltd. - Inventors: Gregory L. Hey-Shipton; Neal Fenzi; Mike Eddy; Ventsislav Yantchev - Web page: https://patentgrep.com/patent/US12224732B2 ## CPC - H03H 9/02228: {Guided bulk acoustic wave devices or Lamb wave devices having interdigital transducers situated in parallel planes on either side of a piezoelectric layer} - H03H 3/02: for the manufacture of piezoelectric or electrostrictive resonators or networks (H03H3/08 takes precedence) - H03H 9/02015: {Characteristics of piezoelectric layers, e.g. cutting angles} - H03H 9/02031: {consisting of ceramic} - H03H 9/132: {characterized by a particular shape} - H03H 9/175: {Acoustic mirrors} - H03H 9/176: {consisting of ceramic material (H03H9/177, H03H9/178 take precedence)} - H03H 9/562: {comprising a ceramic piezoelectric layer} - H03H 9/564: {implemented with thin-film techniques} - H03H 9/568: {consisting of a ladder configuration} - H03H 2003/025: {the resonators or networks comprising an acoustic mirror} - H03H: IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS (waveguides, resonators, lines or other devices of the waveguide type H01P) ## Abstract Resonator devices and filter devices are disclosed. An acoustic resonator includes a substrate and a piezoelectric plate having front and back surfaces separated by a piezoelectric plate thickness greater than or equal to 50 nm and less than or equal to 200 nm. An acoustic Bragg reflector is between the substrate and the back surface of the piezoelectric plate. A conductor pattern including an interdigital transducer (IDT) is on the front surface of the piezoelectric plate. ## Claims ### Claim 1 An acoustic resonator comprising: a substrate; a piezoelectric plate having front and back surfaces and having a piezoelectric plate thickness between the front and back surfaces that is greater than or equal to 50 nm and less than or equal to 200 nm; an acoustic Bragg reflector between the substrate and the back surface of the piezoelectric plate; and a conductor pattern comprising an interdigital transducer (IDT) on the front surface of the piezoelectric plate, wherein the IDT comprises interleaved fingers on the piezoelectric plate and at least a portion of the interleaved fingers have a width that is greater than or equal to 0.2 times a pitch of the IDT and less than or equal to 0.3 times the pitch of the IDT. ### Claim 2 (depends on 1) The acoustic resonator of claim 1, wherein the IDT and the piezoelectric plate are configured such that a radio frequency signal applied to the IDT excites a primary shear acoustic mode within the piezoelectric plate, and the acoustic Bragg reflector is configured to reflect the primary shear acoustic mode. ### Claim 3 (depends on 1) The acoustic resonator of claim 1, wherein the piezoelectric plate is one of lithium niobate and lithium tantalate. ### Claim 4 (depends on 3) The acoustic resonator of claim 3, wherein the piezoelectric plate is one of Z-cut, rotated Z-cut, and rotated Y-cut. ### Claim 5 (depends on 2) The acoustic resonator of claim 2, wherein the acoustic Bragg reflector is configured to reflect the primary shear acoustic mode over a frequency range including a resonance frequency and an anti-resonance frequency of the acoustic resonator device. ### Claim 6 (depends on 1) The acoustic resonator of claim 1, wherein the pitch of the interleaved fingers of the IDT is greater than or equal to 8 times the piezoelectric plate thickness and less than or equal to 15 times the piezoelectric plate thickness. ### Claim 7 A filter device comprising: a plurality of bulk acoustic resonators connected in a ladder filter circuit, each bulk acoustic resonator of the plurality of bulk acoustic resonators comprising: a substrate; a piezoelectric plate having front and back surfaces and a piezoelectric plate thickness between the front and back surfaces that is greater than or equal to 50 nm and less than or equal to 200 nm; an acoustic Bragg reflector between the substrate and the back surface of the piezoelectric plate; and a conductor pattern on the front surface of the piezoelectric plate, the conductor pattern comprising an interdigital transducer (IDT), wherein the plurality of bulk acoustic resonators comprises at least a first shunt resonator and at least a first series resonator, and wherein a thickness of a first dielectric layer over the IDT of the first shunt resonator is greater than a thickness of a second dielectric layer over the IDT of the first series resonator. ### Claim 8 (depends on 1) The acoustic resonator of claim 1, wherein the interleaved fingers of the IDT are substantially aluminum and an IDT finger thickness is greater than or equal to 0.8 times the piezoelectric plate thickness and less than or equal to 1.5 times the piezoelectric plate thickness. ### Claim 9 (depends on 1) The acoustic resonator of claim 1, wherein the piezoelectric plate thickness is less than or equal to 90 nm. ### Claim 10 A filter device comprising: a plurality of bulk acoustic resonators connected in a ladder filter circuit, each bulk acoustic resonator of the plurality of bulk acoustic resonators comprising: a substrate; a piezoelectric plate having front and back surfaces and a piezoelectric plate thickness between the front and back surfaces that is greater than or equal to 50 nm and less than or equal to 200 nm; an acoustic Bragg reflector between the surface of the substrate and the back surface of the piezoelectric plate; and a conductor pattern on the front surface of the piezoelectric plate, the conductor pattern comprising an interdigital transducer (IDT), wherein the IDT of each bulk acoustic resonator comprises interleaved fingers on the piezoelectric plate and at least a portion of the interleaved fingers have a width that is greater than or equal to 0.2 times a pitch of the IDT and less than or equal to 0.3 times the pitch of the IDT. ### Claim 11 (depends on 10) The filter device of claim 10, wherein: the piezoelectric plate and the IDT of each bulk acoustic resonator are configured such that a radio frequency signal applied to the IDT excites a primary acoustic mode in the piezoelectric plate; and the acoustic Bragg reflector is configured to reflect the primary shear acoustic mode excited by the IDT. ### Claim 12 (depends on 11) The filter device of claim 11, wherein the piezoelectric plate of each bulk acoustic resonator is one of lithium niobate and lithium tantalate. ### Claim 13 (depends on 12) The filter device of claim 12, wherein the piezoelectric plate of each bulk acoustic resonator is one of Z-cut, rotated Z-cut, and rotated Y-cut. ### Claim 14 (depends on 11) The filter device of claim 11, wherein the acoustic Bragg reflector of each bulk acoustic resonator is configured to reflect the primary shear acoustic mode at the resonance and antiresonance frequency of the respective resonator. ### Claim 15 (depends on 10) The filter device of claim 10, wherein the IDT of each bulk acoustic resonator has a respective pitch greater than or equal to 8 times the piezoelectric plate thickness and less than or equal to 15 times the piezoelectric plate thickness. ### Claim 16 (depends on 10) The filter device of claim 10, wherein a thickness of the piezoelectric plate under the IDT of the first shunt resonator is greater than a thickness of piezoelectric plate under the IDT of the first series resonator. ### Claim 17 (depends on 10) The filter device of claim 10, wherein the interleaved fingers of the IDT of each bulk acoustic resonator are substantially aluminum and an IDT finger thickness is greater than or equal to 0.8 times the piezoelectric plate thickness and less than or equal to 1.5 times the piezoelectric plate thickness. ### Claim 18 (depends on 10) The filter device of claim 10, wherein the piezoelectric plate thickness of each bulk acoustic resonator is less than or equal to 90 nm.