Memory with one-time programmable (OTP) cells
AssigneeNXP USA, Inc.
InventorsAnirban Roy, Nihaar N. Mahatme, Jon Scott Choy
Life of this patent
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AssigneeNXP USA, Inc.
InventorsAnirban Roy, Nihaar N. Mahatme, Jon Scott Choy
Estimating the term…
A magnetoresistive random access memory (MRAM) array includes MRAM cells, each MRAM cell having a corresponding Magnetic Tunnel Junction (MTJ) capable of being in a blown state or non-blown state, in which the blown state corresponds to a permanent breakdown of a tunnel dielectric layer of the corresponding MTJ. Write circuitry performs a one-time-programmable (OTP) write operation to blow selected MRAM cells. For each MRAM cell being blown, the write circuitry uses an initial OTP program reference for the MRAM cell being blown to detect onset of tunnel dielectric breakdown after application of each OTP write pulse of the OTP write operation. After detection of the onset, the write circuitry updates the initial OTP program reference, applies at least one additional OTP write pulse to the MRAM cell being blown, and uses the updated OTP program reference to verify that current saturation of the MRAM cell being blown has occurred.
A magnetoresistive random access memory (MRAM) comprising:
A method of performing a one-time-programmable (OTP) write to a magnetoresistive random access memory (MRAM) cell to blow the MRAM cell by causing a permanent breakdown of a Magnetic Tunnel Junction (MTJ) of the MRAM cell, the method comprising:
A magnetoresistive random access memory (MRAM) comprising:
Dependencies are inferred from the claim text.