# US 12,223,866 B2 · Display substrate, test method for the same and display device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,223,866 B2 - Document ID: US12223866B2 - Status: Granted - Kind: B2 - Application number: 18/273,066 - Filed: 2022-09-28 - Published: 2024-03-14 - Granted: 2025-02-11 - Earliest claimed: 2021-12-24 - Assignees: Hefei Xinsheng Optoelectronics Technology Co., Ltd.; Boe Technology Group Co., Ltd. - Applicants: Hefei Xinsheng Optoelectronics Technology Co., Ltd.; Boe Technology Group Co., Ltd. - Inventors: Guodong Liu; Peng Wu; Jideng Zhou; Yong Qian - Web page: https://patentgrep.com/patent/US12223866B2 ## CPC - G09G 3/006: {Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309)} - G02F 1/133: Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements (arrangements or circuits for control of liquid crystal elements in a matrix, not structurally associated with these elements G09G3/36) - G06F 3/041: Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means - G06F 3/0412: {Digitisers structurally integrated in a display} - G06F 3/04164: {Connections between sensors and controllers, e.g. routing lines between electrodes and connection pads} - G06F 3/0443: {using a single layer of sensing electrodes} - G06F 11/22: Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing - G09G 3/3648: {using an active matrix (G09G3/367 - G09G3/3696 take precedence)} - H10D 86/441: {Interconnections, e.g. scanning lines} - H10D 86/60: wherein the TFTs are in active matrices - G09G 2300/0408: Integration of the drivers onto the display substrate - G09G 2300/0413: Details of dummy pixels or dummy lines in flat panels - G09G 2300/0426: Layout of electrodes and connections - G09G 2310/0262: The addressing of the pixel, in a display other than an active matrix LCD, involving the control of two or more scan electrodes or two or more data electrodes, e.g. pixel voltage dependent on signals of two data electrodes - G09G 2330/04: Display protection - G09G 2330/12: Test circuits or failure detection circuits included in a display system, as permanent part thereof - G09G 2354/00: Aspects of interface with display user - G09G: ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION (arrangements for transferring data between digital computers and displays G06F3/14; static indicating arrangements comprising an association of a number of separate sources or light control cells G09F9/00; static indicating arrangements comprising integral associations of a number of light sources H01J, H01K, H10H, H05B33/12; scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission, details thereof H04N1/00) - G02F: OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) - H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES ## Abstract A display substrate, a test method for the display substrate and a display device are provided. The display substrate includes a base substrate, a touch detection circuit layer and a pixel driving circuit layer. The display substrate includes a display region and a non-display region surrounding the display region. The touch detection circuit layer includes a driving signal line and a dummy electrode line arranged side by side in the display region and insulated from each other, and both the driving signal line and the dummy electrode line extend from the display region to the non-display region. The non-display region is provided with a plurality of test pads including a first pad electrically connected to the driving signal line and a second pad electrically connected to the dummy electrode line. ## Claims ### Claim 1 A display substrate, comprising a base substrate, a touch detection circuit layer and a pixel driving circuit layer, wherein the display substrate comprises a display region and a non-display region surrounding the display region; the touch detection circuit layer comprises a driving signal line and a dummy electrode line arranged side by side in the display region and insulated from each other, and both the driving signal line and the dummy electrode line extend from the display region to the non-display region; the non-display region is provided with a plurality of test pads comprising a first pad electrically connected to the driving signal line and a second pad electrically connected to the dummy electrode line; wherein the display substrate further comprises a common signal line arranged in the non-display region and surrounding the display region, the dummy electrode line is electrically connected to the common signal line in the non-display region, and the driving signal line and the common signal line are insulated from each other; wherein the display substrate further comprises a driving integrated chip (IC) arranged in the non-display region, the driving signal line is electrically connected to the driving IC at a first connecting point, the first pad is electrically connected to the first connecting point via a first control switch, and the first control switch is configured to control the first connecting point to be electrically connected to, or electrically disconnected from, the first pad; wherein the pixel driving circuit layer comprises a first transparent electrode, an insulating layer and a second transparent electrode laminated one on another in a direction away from the base substrate, the second pad is electrically connected to the dummy electrode line via a connecting trace, and the connecting trace is arranged at a same layer and made of a same material as the first transparent electrode or the second transparent electrode. ### Claim 2 (depends on 1) The display substrate according to claim 1, wherein the dummy electrode line is electrically connected to the driving IC at a second connecting point, the second pad is connected to the second connecting point via a second control switch, and the second control switch is configured to control the second connecting point to be electrically connected to, or electrically disconnected from, the second pad. ### Claim 3 (depends on 2) The display substrate according to claim 2, wherein the first control switch comprises a control end, a first end and a second end, the control end of the first control switch is electrically connected to a control signal line, the first end of the first control switch is electrically connected to the first pad, and the second end of the first control switch is electrically connected to the first connecting point; the second control switch comprises a control end, a first end and a second end, the control end of the second control switch is electrically connected to the control signal line, the first end of the second control switch is electrically connected to the second pad, and the second end of the second control switch is electrically connected to the second connecting point; the control signal line is connected to a third pad of the plurality of test pads. ### Claim 4 (depends on 3) The display substrate according to claim 3, wherein the third pad is electrically connected to a low-level signal terminal of the display substrate. ### Claim 5 (depends on 1) The display substrate according to claim 1, wherein the first pad and the second pad are a same test pad; or, the first pad is electrically connected to the second pad, and an electrostatic ring is provided between adjacent pads of the plurality of test pads. ### Claim 6 (depends on 1) The display substrate according to claim 1, wherein the first pad and the second pad are different test pads, and an electrostatic ring is provided between adjacent test pads in the plurality of test pads. ### Claim 7 (depends on 6) The display substrate according to claim 6, wherein the plurality of test pads comprises at least two rows of test pads arranged in sequence, and the test pads of the two adjacent rows of test pads are arranged in a staggered manner. ### Claim 8 (depends on 6) The display substrate according to claim 6, wherein the electrostatic ring comprises at least one or more anti-static units connected in series, and each anti-static unit comprises a first switch transistor and a second switch transistor, the first switch transistor comprises a control end, a first end and a second end, and the second switch transistor comprises a control end, a first end and a second end; both the control end and the first end of the first switch transistor are electrically connected to a first node, and the second end of the first switch transistor is electrically connected to a second node; both the control end and the first end of the second switch transistor are electrically connected to the second node, and the second end of the second switch transistor is electrically connected to the first node. ### Claim 9 (depends on 1) A display device, comprising the display substrate according to claim 1. ### Claim 10 (depends on 9) The display device according to claim 9, wherein the dummy electrode line is electrically connected to the driving IC at a second connecting point, the second pad is connected to the second connecting point via a second control switch, and the second control switch is configured to control the second connecting point to be electrically connected to, or electrically disconnected from, the second pad. ### Claim 11 (depends on 10) The display device according to claim 10, wherein the first control switch comprises a control end, a first end and a second end, the control end of the first control switch is electrically connected to a control signal line, the first end of the first control switch is electrically connected to the first pad, and the second end of the first control switch is electrically connected to the first connecting point; the second control switch comprises a control end, a first end and a second end, the control end of the second control switch is electrically connected to the control signal line, the first end of the second control switch is electrically connected to the second pad, and the second end of the second control switch is electrically connected to the second connecting point; the control signal line is connected to a third pad of the plurality of test pads. ### Claim 12 (depends on 9) The display device according to claim 9, wherein the first pad and the second pad are a same test pad; or, the first pad is electrically connected to the second pad, and an electrostatic ring is provided between adjacent pads of the plurality of test pads. ### Claim 13 (depends on 9) The display device according to claim 9, wherein the first pad and the second pad are different test pads, and an electrostatic ring is provided between adjacent test pads in the plurality of test pads. ### Claim 14 (depends on 13) The display device according to claim 13, wherein the plurality of test pads comprises at least two rows of test pads arranged in sequence, and the test pads of the two adjacent rows of test pads are arranged in a staggered manner. ### Claim 15 (depends on 13) The display device according to claim 13, wherein the electrostatic ring comprises at least one or more anti-static units connected in series, and each anti-static unit comprises a first switch transistor and a second switch transistor, the first switch transistor comprises a control end, a first end and a second end, and the second switch transistor comprises a control end, a first end and a second end; both the control end and the first end of the first switch transistor are electrically connected to a first node, and the second end of the first switch transistor is electrically connected to a second node; both the control end and the first end of the second switch transistor are electrically connected to the second node, and the second end of the second switch transistor is electrically connected to the first node. ### Claim 16 (depends on 1) A test method for the display substrate according to claim 1, comprising: controlling a first test signal terminal to be electrically connected to the first pad, and providing a first test signal to the first pad through the first test signal terminal; and controlling a second test signal terminal to be electrically connected to the second pad, and providing a second test signal to the second pad through the second test signal terminal; wherein the first test signal and the second test signal are the same. ### Claim 17 (depends on 16) The test method according to claim 16, wherein the dummy electrode line is electrically connected to the driving IC at a second connecting point, the second pad is connected to the second connecting point via a second control switch, and the second control switch is configured to control the second connecting point to be electrically connected to, or electrically disconnected from, the second pad. ### Claim 18 (depends on 17) The test method according to claim 17, wherein the first control switch comprises a control end, a first end and a second end, the control end of the first control switch is electrically connected to a control signal line, the first end of the first control switch is electrically connected to the first pad, and the second end of the first control switch is electrically connected to the first connecting point; the second control switch comprises a control end, a first end and a second end, the control end of the second control switch is electrically connected to the control signal line, the first end of the second control switch is electrically connected to the second pad, and the second end of the second control switch is electrically connected to the second connecting point; the control signal line is connected to a third pad of the plurality of test pads. ### Claim 19 (depends on 16) The test method according to claim 16, wherein the first pad and the second pad are a same test pad; or, the first pad is electrically connected to the second pad, and an electrostatic ring is provided between adjacent pads of the plurality of test pads. ### Claim 20 (depends on 16) The test method according to claim 16, wherein the first pad and the second pad are different test pads, and an electrostatic ring is provided between adjacent test pads in the plurality of test pads.