# US 12,222,367 B2 · Contact pins for test sockets and test sockets comprising the same > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,222,367 B2 - Document ID: US12222367B2 - Status: Granted - Kind: B2 - Application number: 18/130,431 - Filed: 2023-04-04 - Published: 2023-10-05 - Granted: 2025-02-11 - Earliest claimed: 2022-04-05 - Assignees: Okins Electronics Co., Ltd - Applicants: okins electronics Co.,Ltd - Inventors: Jin Kook Jun; Chan Ho Lee; Seung Hyun Noh - Web page: https://patentgrep.com/patent/US12222367B2 ## CPC - G01R 1/0466: {concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding} - G01R 1/07357: {with flexible bodies, e.g. buckling beams} - G01R 31/2863: {Contacting devices, e.g. sockets, burn-in boards or mounting fixtures (in general G01R1/04)} - G01R 1/06716: {Elastic} - G01R 1/073: Multiple probes - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A contact pin for a test socket is provided in the test socket for testing the electrical characteristics of a semiconductor device. The contact pin includes an elastic part elastically deformable in the longitudinal direction of the contact pin; a first contact part which includes a first support part extending from one end of the elastic part and a first contact tip connected to an end of the first support part; and a second contact part which includes a second support part extending from the other end of the elastic part and a second contact tip connected to an end of the second support part, where the elastic part and the second contact part are bent in at least one direction with respect to the first contact part. ## Claims ### Claim 1 A contact pin for a test socket, the contact pin being provided in the test socket for testing electrical characteristics of a semiconductor device, comprising: an elastic part, wherein the elastic part is elastically deformable in a longitudinal direction of the contact pin; a first contact part, wherein the first contact part comprises a first support part extending from a first end of the elastic part and a first contact tip connected to an end of the first support part; and a second contact part, wherein the second contact part comprises a second support part extending from a second end of the elastic part and a second contact tip connected to an end of the second support part, wherein the elastic part and the second contact part are bent in at least one direction with respect to the first contact part. ### Claim 2 (depends on 1) The contact pin of claim 1, wherein the elastic part and the second contact part are bent in a first direction perpendicular to the longitudinal direction and in a second direction perpendicular to the first direction, respectively. ### Claim 3 (depends on 1) The contact pin of claim 1, wherein the first contact part and the second contact part are located on different planes. ### Claim 4 (depends on 1) The contact pin of claim 1, wherein the first contact tip and the second contact tip are located on different lines. ### Claim 5 (depends on 1) The contact pin of claim 1, wherein the contact pin is formed with a stopper for restraining the contact pin to the test socket. ### Claim 6 A test socket for testing electrical characteristics of a semiconductor device, comprising: a housing, wherein a plurality of first through-holes are formed in the housing; a cover, wherein a plurality of second through-holes are formed in the cover; and a plurality of contact pins, wherein the plurality of contact pins are inserted into the plurality of first through-holes and the plurality of second through-holes, wherein the plurality of contact pins comprise: an elastic part, wherein the elastic part is elastically deformable in a longitudinal direction of the contact pin; a first contact part, wherein the first contact part comprises a first support part extending from a first end of the elastic part and a first contact tip connected to an end of the first support part, and the first contact part is inserted into the plurality of first through-holes; and a second contact part, wherein the second contact part comprises a second support part extending from a second end of the elastic part and a second contact tip connected to an end of the second support part, and the second contact part is inserted into the plurality of second through-holes, wherein the elastic part and the second contact part are bent in at least one direction with respect to the first contact part before the plurality of contact pins are inserted into the plurality of second through-holes. ### Claim 7 (depends on 6) The test socket of claim 6, wherein the elastic part and the second contact part are bent in a first direction perpendicular to the longitudinal direction and in a second direction perpendicular to the first direction before the plurality of contact pins are inserted into the plurality of second through-holes, respectively. ### Claim 8 (depends on 6) The test socket of claim 6, wherein the first contact part and the second contact part are located on a same plane. ### Claim 9 (depends on 6) The test socket of claim 6, wherein the first contact tip and the second contact tip are located on a same line. ### Claim 10 (depends on 6) The test socket of claim 6, wherein the contact pin is formed with a stopper for restraining the contact pin to the test socket. ### Claim 11 (depends on 7) The test socket of claim 7, wherein the plurality of first through-holes and the plurality of second through-holes are formed in an oblique shape such that the first contact tip and the second contact tip are located on a second direction axis. ### Claim 12 (depends on 7) The test socket of claim 7, wherein the first contact part is inclined at a certain angle such that the first contact tip and the second contact tip are located on a second direction axis so as to be inserted into the plurality of first through-holes. ### Claim 13 (depends on 12) The test socket of claim 12, wherein while the second contact part is inserted into the plurality of second through-holes, the cover moves the second contact part in the first direction to position the first contact tip and the second contact tip on a first direction axis.