Inspection system for quality analysis of a product to be inspected

An inspection system for quality analysis of a translucent product to be inspected, comprising:

• a conveyor for moving the translucent product to be inspected through an inspection area, generating the movement thereof,
• a lighting device consisting of LEDs that emit a light sequence directed towards the inspection area, such that a light beam emitted by the LEDs lights up the translucent product in the inspection area by transmission of the light beam through the translucent product,
• a linear camera with at least one line of pixels and being configured for collecting a plurality of images in each light sequence of the lighting device, the images being obtained by transmission of the light beam emitted by the lighting device upon passage of the translucent product to be inspected,
• focusing means for focusing the beam emitted by the LEDs,
• wherein the lighting device is configured to be activated in a pulsed manner, generating a light sequence, partially lighting up the translucent product with at least two different illuminations to provide a lighted-up translucent product, at least one of which is a pulsed illumination going through the translucent product, with the pulsed illumination being focused on a forward advancement direction of the conveyor;
• wherein the linear camera is configured to scan the lighted-up translucent product in the inspection area such that the linear camera acquires more than one image of a pixel of the lighted-up translucent product for each forward advancement;
• and
• wherein the lighting device is aligned on an axis formed by the translucent product to be inspected and the linear camera, with the lighting device and the linear camera being arranged on opposite sides of the translucent product.