# US 12,217,797 B2 · Storage device and operating method thereof

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- Number: US 12,217,797 B2
- Document ID: US12217797B2
- Status: Granted
- Kind: B2
- Application number: 17/806,333
- Filed: 2022-06-10
- Published: 2023-05-04
- Granted: 2025-02-04
- Earliest claimed: 2021-11-03
- Assignees: Samsung Electronics Co., Ltd.
- Applicants: Samsung Electronics Co., Ltd.
- Inventors: Hojin Chun; Jiwon Park
- Web page: https://patentgrep.com/patent/US12217797B2

## CPC

- G11C 7/1045: {Read-write mode select circuits}
- G11C 14/0018: {whereby the nonvolatile element is an EEPROM element, e.g. a floating gate or metal-nitride-oxide-silicon [MNOS] transistor}
- G11C 5/143: {Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels (G11C5/148 takes precedence); Switching between alternative supplies (G11C5/141 takes precedence)}
- G11C 5/147: {Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops (G11C5/141 takes precedence)}
- Y02D 10/00: Energy efficient computing, e.g. low power processors, power management or thermal management
- G11C: STATIC STORES (semiconductor memory devices H10B)
- Y02D: CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE

## Abstract

A method of operating a storage device includes: sensing an external voltage supplied from a host device; selecting a data transfer mode, where the data transfer mode is either a normal mode or a brown-out mode according to the external voltage; and performing a write operation or a read operation according to the selected mode, wherein: the data transfer mode is selected as the normal mode when the external voltage is within a normal range between a first operation voltage and a second operation voltage, and the data transfer mode is selected as the brown-out mode when the external voltage is within a low power range below the normal range and between the second operation voltage and a power-off detection voltage; and wherein one or more types of input/output operations of the host device are supported in both the normal mode and the brown-out mode.

## Claims

### Claim 1

An operating method of a storage device, the method comprising:
sensing an external voltage supplied from a host device;
selecting a data transfer mode, wherein the data transfer mode is either a normal mode or a brown-out mode depending upon the external voltage; and
performing a write operation or a read operation according to the selected mode, wherein:
the data transfer mode is selected as the normal mode when the external voltage is within a normal range between a first operation voltage and a second operation voltage, and the data transfer mode is selected as the brown-out mode when the external voltage is within a low power range below the normal range and between the second operation voltage and a power-off detection voltage,
wherein the first operation voltage is a maximum operation voltage of the normal range and the second operation voltage is a minimum operation voltage of the normal range,
wherein the storage device supports a write through operation and a nonvolatile memory device (NVM) buffer operation in both the normal mode and the brown-out mode, and
wherein an operation speed of the brown-out mode is different than an operation speed of the normal mode.

### Claim 2 (depends on 1)

The method of claim 1, wherein:
the sensing the external voltage comprises determining whether the external voltage is lower than the second operation voltage.

### Claim 3 (depends on 2)

The method of claim 2, wherein:
the performing the write operation or the read operation comprises a normal write operation or a normal read operation when the external voltage is within the normal range.

### Claim 4 (depends on 2)

The method of claim 2, wherein:
the sensing the external voltage further comprises determining whether the external voltage is lower than the power-off detection voltage when the external voltage is lower than the second operation voltage.

### Claim 5 (depends on 4)

The method of claim 4, wherein:
the performing the write operation or the read operation further comprises performing a specific input/output operation when the external voltage is below the second operation voltage but not lower than the power-off detection voltage.

### Claim 6 (depends on 4)

The method of claim 4, further comprising:
performing a dumping operation to move data of a buffer memory to a nonvolatile memory device when the external voltage is lower than the power-off detection voltage.

### Claim 7 (depends on 1)

The method of claim 1, wherein:
a specific input/output operation is performed when the data transfer mode is the brown-out mode.

### Claim 8 (depends on 7)

The method of claim 7, wherein:
the specific input/output operation includes at least one of: a pre-power-off operation, a write through operation, a buffer size reduction operation, or a performance throttling operation.

### Claim 9 (depends on 1)

The method of claim 1, further comprising:
performing an operation at limited speed when the data transfer mode is the brown-out mode.

### Claim 10 (depends on 1)

The method of claim 1, further comprising:
performing a nonvolatile memory buffering operation when the data transfer mode is the brown-out mode.

### Claim 11

A storage device comprising:
a current limiter configured to receive an external voltage and to limit current;
at least one voltage regulator configured to receive the external voltage output from the current limiter, and to generate a first power supply voltage, a second power supply voltage, and a third power supply voltage;
a voltage sensor configured to sense the external voltage;
a NAND package configured to receive the first power supply voltage from the at least one voltage regulator, and including a plurality of NAND flash memory devices;
a volatile memory device configured to receive the second power supply voltage from the at least one voltage regulator; and
a controller configured to receive the third power supply voltage from the at least one voltage regulator and to control the NAND package and the volatile memory device, wherein:
the controller receives a voltage information signal from the voltage sensor, and selects a data transfer mode, the data transfer mode being selected as either a normal mode or a brown-out mode in response to the voltage information signal;
wherein the normal mode is selected when the external voltage exists within a normal range between a first operation voltage and a second operation voltage, and the brown-out mode is selected when the external voltage exists within a low power range below the normal range and between the second operation voltage and a power-off detection voltage;
wherein the first operation voltage is a maximum operation voltage of the normal range and the second operation voltage is a minimum operation voltage of the normal range;
wherein the storage device supports a nonvolatile memory device (NVM) buffer operation in both the normal mode and the brown-out mode; and
wherein an operation speed of the brown-out mode is different from an operation speed of the normal mode.

### Claim 12 (depends on 11)

The storage device of claim 11, further comprising:
a power loss prevention circuit configured to monitor the external voltage and to signal the controller to perform a backup operation when the external voltage is cut off or drops below a reference value.

### Claim 13 (depends on 12)

The storage device of claim 12, wherein:
the power loss prevention circuit transmits a power-off detection signal to the controller in a general purpose input/output (GPIO) interface manner.

### Claim 14 (depends on 11)

The storage device of claim 11, further comprising:
a nonvolatile memory device configured to perform a buffering function.

### Claim 15 (depends on 14)

The storage device of claim 14, wherein:
a first buffering operation is performed using the volatile memory device in the normal mode; and
a second buffering operation is performed using the nonvolatile memory device in the brown-out mode.

### Claim 16

An operating method of a storage device, the method comprising:
monitoring an external voltage;
determining whether the external voltage is lower than a minimum operation voltage;
when the external voltage is lower than the minimum operation voltage, determining whether the external voltage is lower than a power-off detection voltage;
performing an input/output operation according to a first brown-out mode when the external voltage is lower than the minimum operation voltage and higher than the power-off detection voltage;
performing an input/output operation according to a normal mode when the external voltage is not lower than the minimum operation voltage; and
dumping a firmware when the external voltage is lower than the power-off detection voltage, wherein the input/output operation according to the first brown-out mode includes a write through operation supported in both the normal mode and the brown-out mode, and wherein an operation speed of the brown-out mode is different from an operation speed of the normal mode.

### Claim 17 (depends on 16)

The method of claim 16, further comprising:
performing a power loss prevention function when the external voltage is cut off or drops below a reference value.

### Claim 18 (depends on 16)

The method of claim 16, further comprising:
performing an input/output operation according to a second brown-out mode when the external voltage is higher than a maximum operation voltage.

### Claim 19 (depends on 16)

The method of claim 16, further comprising:
performing an input/output operation according to the normal mode when the external voltage exists between the minimum operation voltage and a maximum operation voltage.

### Claim 20 (depends on 16)

The method of claim 16, further comprising:
performing a charging operation of an auxiliary power supply included in the storage device according to a second brown-out mode when the external voltage is higher than a maximum operation voltage.
