# US 12,216,155 B2 · Testing method and testing system > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,216,155 B2 - Document ID: US12216155B2 - Status: Granted - Kind: B2 - Application number: 17/936,850 - Filed: 2022-09-30 - Published: 2023-04-27 - Granted: 2025-02-04 - Earliest claimed: 2021-10-26 - Assignees: Realtek Semiconductor Corp. - Applicants: Realtek Semiconductor Corporation - Inventors: Yi-Nan Kuo; Ming-Chung Huang - Web page: https://patentgrep.com/patent/US12216155B2 ## CPC - G01R 31/2879: {related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads} - G01R 31/2894: {Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875)} - G01R 19/16552: {in I.C. power supplies} - G01R 23/16: Spectrum analysis; Fourier analysis - G01R 31/30: Marginal testing, e.g. by varying supply voltage (testing computers during standby operation or idle time G06F11/22) - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract An testing method includes following operations: generating, by a signal generator, a multi-tone signal; transmitting, by the signal generator, the multi-tone signal to an input terminal of an under-test device; measuring, by a spectrum analyzer, the input terminal of the under-test device and an output terminal of the under-test device to acquire a plurality of input ripple intensities corresponding to a plurality of frequencies and acquire a plurality of output ripple intensities corresponding to the frequencies; and generating, by a control device, a plurality of power supply rejection ratios corresponding to the frequencies according to the input ripple intensities and the output ripple intensities. ## Claims ### Claim 1 A testing method, comprising: generating, by a signal generator, a multi-tone signal, wherein the multi-tone signal comprises a plurality of components with a plurality of frequencies; transmitting, by the signal generator, the multi-tone signal to an input terminal of an under-test device; measuring, by a spectrum analyzer, the input terminal of the under-test device and an output terminal of the under-test device to acquire a plurality of input ripple intensities corresponding to the frequencies and acquire a plurality of output ripple intensities corresponding to the frequencies, comprising: controlling, by a control device, a switching device to couple the spectrum analyzer to the input terminal; measuring, by the spectrum analyzer, the input terminal to acquire the input ripple intensities corresponding to the frequencies; controlling, by the control device, the switching device to couple the spectrum analyzer to the output terminal after the spectrum analyzer acquires the input ripple intensities; and measuring, by the spectrum analyzer, the output terminal to acquire the output ripple intensities corresponding to the frequencies; and generating, by the control device, a plurality of power supply rejection ratios corresponding to the frequencies according to the input ripple intensities and the output ripple intensities. ### Claim 2 (depends on 1) The testing method of claim 1, wherein the under-test device is a power IC. ### Claim 3 (depends on 1) The testing method of claim 1, further comprising: generating, by the control device, a result report according to the power supply rejection ratios corresponding to the frequencies. ### Claim 4 (depends on 1) The testing method of claim 1, further comprising: subtracting, by the control device, one of the output ripple intensities from one of the input ripple intensities to generate one of the power supply rejection ratios, wherein the one of the output ripple intensities, the one of the input ripple intensities, and the one of the power supply rejection ratios correspond to one of the frequencies. ### Claim 5 (depends on 1) The testing method of claim 1, further comprising: superimposing, by the signal generator, a plurality of sine waves to generate the multi-tone signal, wherein the sine waves correspond to the frequencies respectively. ### Claim 6 (depends on 1) The testing method of claim 1, further comprising: performing, by the signal generator, an inverse Fourier Transformation process to generate the multi-tone signal. ### Claim 7 (depends on 1) The testing method of claim 1, further comprising: transmitting, by the signal generator, a combination of the multi-tone signal and a direct-current signal to the input terminal of the under-test device; and measuring, by a direct-current measuring device, the input terminal of the under-test device and the output terminal of the under-test device respectively to acquire an input direct-current component signal and an output direct-current component signal. ### Claim 8 A testing system, comprising: a signal generator configured to generate a multi-tone signal and transmit the multi-tone signal to an input terminal of an under-test device, wherein the multi-tone signal comprises a plurality of components with a plurality of frequencies; a spectrum analyzer coupled to the under-test device and configured to measure the input terminal of the under-test device and an output terminal of the under-test device to acquire a plurality of input ripple intensities corresponding to the frequencies and acquire a plurality of output ripple intensities corresponding to the frequencies; a control device coupled to the spectrum analyzer and configured to generate a plurality of power supply rejection ratios corresponding to the frequencies according to the input ripple intensities and the output ripple intensities; and a switching device, wherein the control device is configured to control the switching device to couple the spectrum analyzer to the input terminal, and the spectrum analyzer measures the input terminal to acquire the input ripple intensities corresponding to the frequencies, wherein after the spectrum analyzer acquires the input ripple intensities, the control device is further configured to control the switching device to couple the spectrum analyzer to the output terminal, and the spectrum analyzer measures the output terminal to acquire the output ripple intensities corresponding to the frequencies. ### Claim 9 (depends on 8) The testing system of claim 8, wherein the under-test device is a power IC. ### Claim 10 A testing system, comprising: a signal generator configured to generate a multi-tone signal and transmit the multi-tone signal to an input terminal of an under-test device, wherein the multi-tone signal comprises a plurality of components with a plurality of frequencies; a spectrum analyzer coupled to the under-test device and configured to measure the input terminal of the under-test device and an output terminal of the under-test device to acquire a plurality of input ripple intensities corresponding to the frequencies and acquire a plurality of output ripple intensities corresponding to the frequencies; a control device coupled to the spectrum analyzer and configured to generate a plurality of power supply rejection ratios corresponding to the frequencies according to the input ripple intensities and the output ripple intensities; and a switching device, wherein the control device is configured to control the switching device to couple the spectrum analyzer to the output terminal, and the spectrum analyzer measures the output terminal to acquire the output ripple intensities corresponding to the frequencies, wherein after the spectrum analyzer acquires the output ripple intensities, the control device is further configured to control the switching device to couple the spectrum analyzer to the input terminal, and the spectrum analyzer measures the input terminal to acquire the input ripple intensities corresponding to the frequencies. ### Claim 11 (depends on 10) The testing system of claim 10, wherein the switching device is a single pole double throw switch. ### Claim 12 (depends on 10) The testing system of claim 10, wherein the control device is further configured to subtract one of the output ripple intensities from one of the input ripple intensities to generate one of the power supply rejection ratios, wherein the one of the output ripple intensities, the one of the input ripple intensities, and the one of the power supply rejection ratios correspond to one of the frequencies. ### Claim 13 (depends on 10) The testing system of claim 10, wherein the signal generator is further configured to superimpose a plurality of sine waves to generate the multi-tone signal, wherein the sine waves correspond to the frequencies respectively. ### Claim 14 (depends on 10) The testing system of claim 10, wherein the signal generator is further configured to perform an inverse Fourier Transformation process to generate the multi-tone signal. ### Claim 15 (depends on 10) The testing system of claim 10, wherein the signal generator is further configured to transmit a combination of the multi-tone signal and a direct-current signal to the input terminal of the under-test device.