# US 12,216,149 B2 · Degradation detection device and degradation detection method > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,216,149 B2 - Document ID: US12216149B2 - Status: Granted - Kind: B2 - Application number: 17/408,041 - Filed: 2021-08-20 - Published: 2022-03-24 - Granted: 2025-02-04 - Earliest claimed: 2020-09-18 - Assignees: Kabushiki Kaisha Toshiba; Toshiba Electronic Devices & Storage Corporation - Applicants: Kabushiki Kaisha Toshiba; Toshiba Electronic Devices & Storage Corporation - Inventors: Hideaki Majima - Web page: https://patentgrep.com/patent/US12216149B2 ## CPC - G01R 31/2608: {for testing bipolar transistors} - G01R 31/2621: {for testing field effect transistors, i.e. FET's} - H03K 5/24: the characteristic being amplitude - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H03K: PULSE TECHNIQUE (measuring pulse characteristics G01R; modulating sinusoidal oscillations with pulses H03C; transmission of digital information H04L; discriminator circuits detecting phase difference between two signals by counting or integrating cycles of oscillation H03D3/04; automatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses where the type of generator is irrelevant or unspecified H03L; coding, decoding or code conversion, in general H03M) ## Abstract According to one embodiment, a degradation detection device includes a driving circuit that supplies a driving signal that controls on/off of an output transistor to the output transistor and an output circuit that compares a value of integral of an output current that is output by the output transistor in an off-state thereof over a predetermined period of time with a predetermined threshold when the output transistor is turned from an on-state thereof to an off-state thereof and outputs a signal that indicates a degradation state of the output transistor depending on a result of such comparison. ## Claims ### Claim 1 A degradation detection device, comprising: an output transistor with a source and a drain connected between a power source supply terminal and an output terminal; a driving circuit that supplies a driving signal that controls on/off of the output transistor to the output transistor; and an output circuit configured to: integrate an output current that is discharged from a source side of the output transistor according to a drain charge over a predetermined period of time when the output transistor is shifted from an on-state thereof to an off-state thereof; compare a value of an integral of the output current with a predetermined threshold; and output a signal that indicates that degradation of the output transistor is absent in response to the value of the integral being larger than the predetermined threshold and that the degradation of the output transistor is present in response to the value of the integral being smaller than the predetermined threshold. ### Claim 2 (depends on 1) The degradation detection device according to claim 1, wherein the predetermined period of time is a period of time from a timing when the driving circuit supplies a driving signal that shifts the output transistor from an on-state thereof to an off-state thereof to the output transistor to a timing when a driving signal that shifts the output transistor that is shifted to an off-state thereof to an on-state thereof is supplied to the output transistor. ### Claim 3 (depends on 1) The degradation detection device according to claim 1, further comprising: a second output transistor that has a main current path that is connected in series with the main current path of the output transistor and is supplied with the output current of the output transistor, wherein the output circuit includes: a voltage/current conversion circuit that converts a voltage that is generated on the main current path of the second output transistor into a current; and an integration circuit that integrates an output current of the voltage/current conversion circuit. ### Claim 4 (depends on 1) The degradation detection device according to claim 1, wherein the output transistor is a GaN (gallium nitride) transistor. ### Claim 5 (depends on 1) The degradation detection device according to claim 1, further comprising: an inductor with one end that is supplied with an output current of the output transistor; and an output capacitor with one end that is connected to the other end of the inductor and the other end that is grounded. ### Claim 6 A degradation detection method, comprising: shifting an output transistor with a source and a drain connected between a power source supply terminal and an output terminal from an on-state thereof to an off-state thereof; integrating an output current that is discharged from a source side of the output transistor according to a drain charge over a predetermined period of time when the output transistor is shifted to the off-state thereof to obtain a value of an integral of the output current; comparing the value of the integral with a predetermined threshold; and outputting a signal that indicates that degradation of the output transistor is absent in response to the value of the integral being larger than the predetermined threshold and that the degradation of the output transistor is present in response to the value of the integral being smaller than the predetermined threshold. ### Claim 7 (depends on 6) The degradation detection method according to claim 6, wherein the output transistor is a GaN (gallium nitride) transistor. ### Claim 8 (depends on 6) The degradation detection method according to claim 6, further comprising supplying a driving signal that controls on/off of the output transistor to the output transistor, wherein the predetermined period of time is a period of time from a timing when the driving circuit supplies a driving signal that shifts the output transistor from an on-state thereof to an off-state thereof to the output transistor to a timing when a driving signal that shifts the output transistor from an off-state thereof to an on-state thereof is supplied to the output transistor. ### Claim 9 (depends on 6) The degradation detection method according to claim 6, further comprising supplying the output current of the output transistor to a second output transistor that has a main current path that is connected in series with the main current path of the output transistor; and is supplied with the output current of the output transistor, wherein the step of integrating includes converting a voltage that is generated on the main current path of the second output transistor by the output current into a current and integrating the current that is converted from the voltage. ### Claim 10 A degradation detection device, comprising: a first output transistor that has a main current path with one end that is connected to a power source supply terminal; a second output transistor that has a main current path with one end that is connected to the other end of the main current path of the first output transistor and the other end that is connected to an output terminal; a third output transistor that has a main current path with one end that is connected to the other end of the main current path of the second output transistor; a fourth output transistor with one end that is connected to the other end of the main current path of the third output transistor and the other end that is grounded; a driving circuit that supplies a driving signal that controls on/off of the first to fourth output transistors to the first to fourth output transistors; and a determination circuit that compares a value of an integral of an output current that is output by the first output transistor in an off-state thereof over a predetermined period of time with a predetermined threshold when the first output transistor is turned from an on-state thereof to an off-state thereof, and outputs a signal that indicates a degradation state of the first output transistor depending on a result of such comparison. ### Claim 11 (depends on 10) The degradation detection device according to claim 10, wherein the determination circuit compares a value of an integral of an output current that is output by the third output transistor in an off-state thereof over a predetermined period of time with a predetermined threshold when the third output transistor is turned from an on-state thereof to an off-state thereof, and outputs a signal that indicates a degradation state of the third output transistor depending on a result of such comparison. ### Claim 12 (depends on 10) The degradation detection device according to claim 10, further comprising: an integration circuit that has: a conversion circuit that converts a voltage that is generated on the main current path of the second output transistor into a current; an amplification circuit with a first input terminal that is supplied with an output current of the conversion circuit and a second input terminal that is grounded; and a capacitor that is connected between an output terminal of the amplification circuit and the first input terminal, wherein an output signal of the integration circuit is supplied to the determination circuit. ### Claim 13 (depends on 12) The degradation detection device according to claim 12, comprising a switch that is connected between both ends of the capacitor where on/off thereof is controlled by the driving circuit. ### Claim 14 (depends on 10) The degradation detection device according to claim 10, wherein the predetermined period of time is a period of time from a timing when the driving circuit supplies a driving signal that shifts the first output transistor from an on-state thereof to an off-state thereof to the first output transistor to a timing when a driving signal that shifts the first output transistor that is shifted to an off-state thereof to an on-state thereof is supplied to the first output transistor. ### Claim 15 (depends on 10) The degradation detection device according to claim 10, wherein: the first and third output transistors are GaN (gallium nitride) transistors; and the second and fourth output transistors are Si (silicon) transistors. ### Claim 16 (depends on 10) The degradation detection device according to claim 10, wherein the determination circuit determines that the first output transistor is not degraded in a case where the value of the integral is the predetermined threshold or greater. ### Claim 17 (depends on 10) The degradation detection device according to claim 10, further comprising: an inductor with one end that is supplied with an output current of the second output transistor; and an output capacitor with one end that is connected to the other end of the inductor and the other end that is grounded. ### Claim 18 (depends on 10) The degradation detection device according to claim 10, wherein the driving circuit turns on/off the first and second output transistors in a complementary manner with respect to the third and fourth output transistors.