# US 12,216,139 B2 · Adaptive flexible chip test socket and formation method thereof > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,216,139 B2 - Document ID: US12216139B2 - Status: Granted - Kind: B2 - Application number: 18/432,932 - Filed: 2024-02-05 - Published: 2024-12-12 - Granted: 2025-02-04 - Earliest claimed: 2023-06-06 - Assignees: Semight Instruments Co., Ltd - Applicants: Semight Instruments Co., Ltd - Inventors: Zhe Lian; Jianjun Huang; Yonghong Wu; Shan Zhao; Haiyang Hu - Web page: https://patentgrep.com/patent/US12216139B2 ## CPC - G01R 1/0441: {Details} - G01R 1/04: Housings; Supporting members; Arrangements of terminals - G01R 1/0466: {concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding} - G01R 1/0483: {Sockets for unleaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips} - G01R 3/00: Apparatus or processes specially adapted for the manufacture {or maintenance} of measuring instruments {, e.g. of probe tips} - G01R 31/28: Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits G01R31/002;} testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers {or computer components} G06F11/00; checking static stores for correct operation G11C29/00 {; testing receivers or transmitters of transmission systems H04B17/00}) - G01R 31/2886: {Features relating to contacting the IC under test, e.g. probe heads; chucks (G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06)} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract The present disclosure includes an adaptive die test socket and a formation method. The die test socket includes an upper test socket and a lower test socket disposed directly below the upper test socket. The upper test socket is connected to a support frame; a strip-shaped through hole is formed on an upper surface of the support frame; a first protruding strip is at each of lower portions of two opposite inner walls of the strip-shaped through hole; a corresponding second protruding strip is at each of upper portions of two opposite side surfaces of the installation plate; and a side of a strip-shaped block is fixedly connected to the upper surface of the support frame, and another side of the strip-shaped block extends to directly above the second protruding strip and is connected to the second protruding strip through at least two springs. ## Claims ### Claim 1 An adaptive die test socket, comprising: an upper test socket and a lower test socket disposed directly below the upper test socket, wherein the upper test socket and the lower test socket are capable of moving relative to each other along a vertical direction; and a groove is formed at a lower surface of the upper test socket and/or at an upper surface of the lower test socket, such that an accommodating chamber for placing a die to-be-tested is formed between the upper test socket and the lower test socket at a mold-closed state, wherein: the upper test socket is connected to a support frame through an installation plate disposed above the upper test socket, wherein the support frame is capable of moving along a vertical direction; a strip-shaped through hole is formed on an upper surface of the support frame; a first protruding strip is at each of lower portions of two opposite inner walls of the strip-shaped through hole; a corresponding second protruding strip extending directly above the first protruding strip is at each of upper portions of two opposite side surfaces of the installation plate; a strip-shaped block is disposed above each second protruding strip; and a side of the strip-shaped block is fixedly connected to the upper surface of the support frame, and another side of the strip-shaped block extends to directly above the second protruding strip and is connected to the second protruding strip through at least two springs; when the upper test socket and the lower test socket are at a mold-opening state, a lower surface of the second protruding is adjoined to be in a contact with an upper surface of a corresponding first protruding strip; and when the upper test socket and the lower test socket are at the mold-closed state, the lower surface of the upper test socket is tightly attached to the upper surface of the lower test socket, and a gap is formed between the lower surface of the second protruding strip and the upper surface of the first protruding strip. ### Claim 2 (depends on 1) The adaptive die test socket according to claim 1, wherein: each second protruding strip is connected to the strip-shaped block by a plurality of springs arranged at an equal interval along a length direction of the strip-shaped block. ### Claim 3 (depends on 1) The adaptive die test socket according to claim 1, wherein: an installation groove for an end portion of a spring to be inserted is formed at an upper surface of the second protruding strip and/or at a lower surface of the strip-shaped block. ### Claim 4 (depends on 1) The adaptive die test socket according to claim 1, wherein: the strip-shaped through hole is formed at a horizontal portion of the support frame; and a vertical portion of the support frame is installed on a surface of a side of an installation base plate, which is vertically configured, through at least two sets of vertical guiding rails and vertical sliding blocks matched with each other. ### Claim 5 (depends on 4) The adaptive die test socket according to claim 4, wherein: the horizontal portion of the support frame is at an upper end of the vertical portion and extends to another side of the installation base plate. ### Claim 6 (depends on 4) The adaptive die test socket according to claim 4, wherein: a horizontal base is installed on a surface of another side of the installation base plate and below the horizontal portion of the support frame; two horizontal guiding rails in parallel with and spaced apart with each other are installed on an upper surface of the horizontal base; a lower surface of a movable plate is connected to each horizontal guiding rail through at least two horizontal sliding blocks; and the lower test socket is installed on the movable plate. ### Claim 7 (depends on 6) The adaptive die test socket according to claim 6, wherein: a two-way sliding platform is installed on an upper surface of the movable plate; and the lower test socket is installed on a movable portion of the two-way sliding platform at a side opposite to the movable plate. ### Claim 8 (depends on 1) The adaptive die test socket according to claim 1, wherein: a limiting protruding block is disposed at the upper surface of the lower test socket and directly below each of four corners of the groove. ### Claim 9 (depends on 8) The adaptive die test socket according to claim 8, wherein: an avoiding groove for the limiting protruding block to be inserted is formed at the lower surface of the upper test socket. ### Claim 10 (depends on 8) The adaptive die test socket according to claim 8, wherein: the limiting protruding block is an L-shaped protruding block.