Photonic wafer level testing systems, devices, and methods of operation

A photonic testing device comprising:

• a substrate;
• an optical device under test (DUT) located on the substrate and comprising an input waveguide configured to receive a combined optical test signal, the optical DUT being configured to respond to the combined optical test signal;
• an optical input circuit located on the substrate, the optical input circuit comprising
• a first plurality of inputs configured to receive a plurality of optical test signals provided at respective inputs of the first plurality of inputs, wherein each of the plurality of optical test signals comprises a respective dominant wavelength of a plurality of dominant wavelengths, and
• an output configured to combine the plurality of optical test signals into the combined optical test signal at the output, and transmit the combined optical test signal through the output to the input waveguide of the optical DUT;
• and
• an optical output circuit located on the substrate, the optical output circuit comprising
• an input of the optical output circuit configured to receive a combined optical response signal comprising a plurality of optical response signals, and
• a plurality of outputs of the optical output circuit configured to split the combined optical response signal into the plurality of optical response signals to be measured at each of the plurality of outputs, each of the plurality of optical response signals comprising a respective dominant wavelength of the plurality of dominant wavelengths, and
• wherein the optical DUT further comprises an output waveguide configured to transmit the combined optical response signal to the input of the optical output circuit.

A photonic testing device comprising:

• a substrate;
• an optical device under test (DUT) located on the substrate and comprising an input waveguide configured to receive a combined optical test signal, the optical DUT being configured to respond to the combined optical test signal;
• an optical input circuit located on the substrate, the optical input circuit comprising
• a first plurality of inputs configured to receive a plurality of optical test signals provided at respective inputs of the first plurality of inputs, wherein each of the plurality of optical test signals comprises a respective dominant wavelength of a plurality of dominant wavelengths, and
• an output configured to combine the plurality of optical test signals into the combined optical test signal at the output, and transmit the combined optical test signal through the output to the input waveguide of the optical DUT;
• and
• wherein the optical input circuit further comprises
• a second plurality of inputs configured to receive the plurality of optical test signals at respective inputs of the second plurality of inputs, the second plurality of inputs corresponding to the first plurality of inputs in a one to one ratio;
• the output is further configured to combine the plurality of optical test signals by combining both the optical test signals from the first plurality of inputs and the optical test signals from the second plurality of inputs into the combined optical test signal;
• the plurality of optical test signals received at the first plurality of inputs comprise only a single type of transverse mode, the single type of transverse mode being the transverse electric (TE) mode;
• the plurality of optical test signals provided at the second plurality of inputs comprise only the single type of transverse mode;
• and
• the combined optical test signal comprises exactly two types of transverse mode, the two types of transverse mode being the TE mode and the transverse magnetic (TM) mode.