Process tool for analyzing bonded workpiece interface
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHau-Yi Hsiao, Kuo-Ming Wu, Chun Liang Chen, Sheng-Chau Chen
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHau-Yi Hsiao, Kuo-Ming Wu, Chun Liang Chen, Sheng-Chau Chen
Estimating the term…
The present disclosure relates to a method and an associated process tool. The method includes generating electromagnetic radiation that is directed toward a perimeter of a pair of bonded workpieces and toward a radiation sensor that is arranged behind the perimeter of the pair of bonded workpieces. The electromagnetic radiation is scanned along a vertical axis. An intensity of the electromagnetic radiation that impinges on the radiation sensor is measured throughout the scanning. Measuring the intensity includes recording a plurality of intensity values of the electromagnetic radiation at a plurality of different positions along the vertical axis extending past top and bottom surfaces of the pair of bonded workpieces. A position of an interface between the pair of bonded workpieces is determined based on a maximum measured intensity value of the plurality of intensity values.
A method, comprising:
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