Method of detecting internal stress distribution of transparent material based on x-ray diffraction

A method of detecting an internal stress distribution of a transparent material based on an X-ray diffraction, comprising:

• (S1) establishing coordinates of stress detection positions of a transparent material through steps of:
• establishing a spatial rectangular coordinate system o-x-y-z with an origin o being located at a surface of the transparent material, wherein a number of the stress detection positions is n;
• and under the spatial rectangular coordinate system, coordinates of an ith stress detection position Pi are represented by (xi,yi,zi), wherein i=1, 2, 3, . . . , n;
• (S2) pre-processing an initial powder of the transparent material and a standard reference material Bi;
• (S3) calculating a placement coordinate position of the standard reference material Bi on the transparent material through steps of:
• placing the initial powder of the transparent material in a synthesis mold;
• determining, using an Archimedes drainage method, a volume V1 of the initial powder of the transparent material contained in the synthesis mold and a volume V2 of the transparent material after being sintered, wherein a sintering shrinkage of the transparent material is expressed by:
• α
• =
• V
• 2
• V
• 1
• ;
• and
• setting the placement coordinate position of the standard reference material Bi at the ith stress detection position Pi as Pif expressed by (Xi,Yi,Zi);
• wherein Xi=α/xi, Yi=α/yi, and Zi=α/zi;
• (S4) synthesizing a standard reference material-containing transparent material through steps of:
• loading the initial powder of the transparent material and the standard reference material Bi in the synthesis mold, wherein the standard reference material Bi is located at Pif;
• and
• transferring the synthesis mold to a sintering device for sintering to synthesize the standard reference material-containing transparent material;
• and
• (S5) detecting a pressure of the standard reference material Bi in the standard reference material-containing transparent material using an X-ray diffraction as an internal stress pPi of the standard reference material-containing transparent material at Pi through steps of:
• determining a pressure load of the standard reference material Bi located at the ith stress detection position Pi in the standard reference material-containing transparent material as the internal stress of the standard reference material-containing transparent material at the ith stress detection position Pi;
• and
• measuring a spectrum of the standard reference material Bi located at the ith stress detection position Pi on the standard reference material-containing transparent material using an X-ray diffractometer, wherein a corresponding shifted peak position is represented by l1Pi;
• measuring a spectrum of the standard reference material Bi using the X-ray diffractometer, wherein a corresponding original peak position is represented by l2Pi;
• and
• calculating the internal stress pPi of the standard reference material-containing transparent material at the ith stress detection position Pi through the following formula:
• p
• Pi
• =
• ❘
• "\[LeftBracketingBar]"
• (
• l
• 2
• Pi
• -
• l
• 1
• Pi
• )
• ❘
• "\[RightBracketingBar]"
• ×
• β
• i
• ;
• wherein βi represents a linear shift of an original peak of the standard reference material Bi under a unit pressure.