Structure information acquisition method and structure information acquisition apparatus
AssigneesRigaku Corporation, Toyota Jidosha Kabushiki Kaisha
InventorsMasashi Kageyama, Kenichi Okajima, Masaru Kuribayashi, Yuzo Miura, Yuichi Nagamatsu
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Abstract
There is provided a technique for non-destructively and relatively easily acquiring orientation information of an anisotropic material even for a large-sized object. An object is irradiated with X-rays in a tangential direction of a curved anisotropic material from a radiation source of a phase-contrast X-ray optical system. A scattering image is then obtained using a detection signal of X-rays having penetrated through the object. Structure information of the anisotropic material is acquired based on the scattering image.
Claims6
A structure information acquisition method for acquiring structure information of an object having a anisotropic material which is extended in a predetermined direction and curved using a phase-contrast X-ray optical system, the structure information acquisition method comprising:
- a step of irradiating the object with X-rays along a tangent line of the curved anisotropic material and in the extended direction of the anisotropic material from a radiation source of the phase-contrast X-ray optical system;
- a step of obtaining a scattering image using a detection signal of the X-rays having penetrated through the object;
- and
- a step of acquiring structure information of the anisotropic material based on contrast in the scattering image according to a degree of misalignment between the extended direction of the anisotropic material and the direction of X-rays.
A structure information acquisition apparatus, comprising:
- a phase-contrast X-ray optical system for acquiring a scattering image of an object;
- and
- a processor implemented computer hardware and computer software, wherein
- the phase-contrast X-ray optical system includes a grating, a radiation source for irradiating the grating and the object with X-rays, and a detector for detecting the X-rays having passed through the grating and the object,
- the object includes a anisotropic material which is extended in a predetermined direction and curved,
- a direction of the X-rays from the radiation source is along a tangent line of the curved anisotropic material and in the extended direction of the anisotropic material, and
- the processor is configured to
- obtain a scattering image based on an intensity distribution image of the X-rays obtained by the detector, and
- extract structure information of the anisotropic material based on contrast in the scattering image according to a degree of misalignment between the extended direction of the anisotropic material and the direction of X-rays.
Dependencies are inferred from the claim text.