Lapping device for gear helix artifact with equal common normal by rolling method

A lapping device for gear helix artifact with equal common normal by rolling method, comprising a whetstone component, a baffle component, a multi-ball bearing plate component, a whetstone driven component, a roller component, a foundation component, a position baffle for the base-circle plate, a rail component, a spring clamp with a guide pillar, a rotary table component, wherein the rail component is fixed on the foundation component, one side of the rail component and the foundation component is positioned with the position baffle for the base-circle plate, the roller component is located on the rail component;

• in a groove of the foundation component, between two guide rails, the whetstone component is located above the rotary table component and is clamped with the spring clamp with guide pillar;
• in the same working plane between the whetstone component and the rotary table component, the whetstone driven component, the multi-ball bearing plate component and the baffle component are arranged from inside to outside;
• the multi-ball bearing plate component comprises a multi-ball bearing plate A, a multi-ball bearing plate B, a multi-ball bearing plate C and a multi-ball bearing plate D to form four faces of a rectangular space;
• the whetstone driven component comprises a wedge A, a wedge B, an adapter fora rotary table, a T-slot snap ring, a clamp for a micrometer, and the micrometer;
• the wedge A is provided with a connecting screw holes for installing a whetstone connecter;
• a rail surface of the wedge A and the multi-ball bearing plate D after lapping can be used as vertical rail surfaces, the rail surfaces of the wedge A and the wedge B respectively in contact with the multi-ball bearing plate A and the multi-ball bearing plate C after lapping can be used as horizontal rail surfaces;
• the bottom surface of the wedge B, as the rail surface for bottom plate, is attached a PTFE rail belt, which can reach a target accuracy by scraping;
• the wedge rail surface between the wedge A and the wedge B is attached with a PTFE rail belt, which can reach the target accuracy by scraping;
• there is a T-slot on the wedge B, which cooperates with the T-slot snap ring to realize advance and pull-back of the micrometer;
• there is a fixing hole for the micrometer on the clamp for the micrometer for installing the micrometer, tighten on the adapter for rotary table with a connecting screw;
• the micrometer cooperates with the T-slot snap ring to realize a horizontal movement of the wedge B, then push the wedge A to make a linear movement in a vertical direction to change the lapping work area of whetstone.