# US 12,192,658 B2 · Interface circuit for photodetectors providing full-frame integration and pixel-level digitization

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- Number: US 12,192,658 B2
- Document ID: US12192658B2
- Status: Granted
- Kind: B2
- Application number: 18/111,233
- Filed: 2023-02-17
- Published: 2024-02-15
- Granted: 2025-01-07
- Earliest claimed: 2022-02-22
- Assignees: Nu-Trek, Inc.
- Applicants: Nu-Trek, Inc.
- Inventors: Stephen Holden Black; Paul Richard Behmen; Francisco Tejada
- Web page: https://patentgrep.com/patent/US12192658B2

## CPC

- H04N 25/77: Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N 25/772: comprising A/D, V/T, V/F, I/T or I/F converters
- G01J 1/44: Electric circuits {(for command of an exposure part G03B7/02)}
- G01J 5/20: using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01R 19/0038: {Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)}
- H04N 25/57: Control of the dynamic range
- H04N 25/78: Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
- G01J 2005/202: {Arrays}
- H04N 25/21: for transforming thermal infrared radiation into image signals
- H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION
- G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

A photodetector interface circuit is described, residing partially or fully within a unit cell per pixel of an FPA. The interface circuit uses an innovative approach to providing pixel level digitization for full frame integration times while maintaining the ability to use integration capacitors of practical sizes. The technique uses successive charge subtraction, removing charge from an integration capacitor successively, triggered by the charge increasing sufficiently to charge the integrator to a reference level, thereby triggering both charge removal and incrementing a count, until all of the current flowing in the photodetector has been accounted for and the count represents the digitization of the photodetector signal. Various options on how to arrange the digitization elements are also disclosed.

## Claims

### Claim 1

An interface circuit for a photodetector providing digitization of the current flowing in the detector, comprising;
a bias circuit connected to one terminal of the photodetector;
a transimpedance amplifier having a capacitive feedback element as an integrator of the detector current, the feedback element connected between the amplifier output and a node connected to one of the sink or source current from the photodetector and the negative input of the amplifier, wherein the feedback element is periodically reset;
a voltage comparator configured to compare the output of the transimpedance amplifier with a predetermined reference voltage;
a charge subtraction circuit configured to remove a quantity of charge from the transimpedance amplifier's feedback element when triggered by the voltage comparator; and,
a digital counter configured to count the number of charge subtraction events over a frame period.

### Claim 2 (depends on 1)

The interface circuit of claim 1 wherein the photodetector is a bolometer.

### Claim 3 (depends on 1)

The interface circuit of claim 1 wherein the photodetector is a photoconductor.

### Claim 4 (depends on 1)

The interface circuit of claim 1 wherein the photodetector is part of an imaging array, each photodetector pixel in the array associated with a unit cell of a Read Out Integrated Circuit integrated with the array of photodetectors, and at least one or more elements of the interface circuit are part of a unit cell per pixel, and wherein the array of photodetectors and the ROIC are microfabricated using at least one CMOS silicon wafer.

### Claim 5 (depends on 1)

The interface circuit of claim 1 wherein all of the interface circuit elements are fabricated within each unit cell.

### Claim 6 (depends on 1)

The interface circuit of claim 1 wherein the counter is located outside the unit cell.

### Claim 7 (depends on 1)

The interface circuit of claim 1 wherein the counter is fabricated on at least one second CMOS wafer, and integrated with the array and ROIC using 3-dimensional circuit integration techniques.

### Claim 8 (depends on 1)

The interface circuit of claim 1 wherein the counter is fabricated utilizing carbon nanotube CMOS logic and is integrated above the ROIC's active circuitry.

### Claim 9 (depends on 1)

The interface circuit of claim 1 further comprising a reference voltage applied to the positive terminal of the transimpedance integration amplifier.

### Claim 10 (depends on 1)

The interface circuit of claim 1 further comprising a clamp capacitor connected between the node connected to one of the sink or source current from the photodetector and the amplifier's negative input.

### Claim 11 (depends on 10)

The interface circuit of claim 10 further comprising a switch connecting the node to sink or source current from the photodetector to an independent voltage source, the switch activated while the feedback element is in reset, wherein the voltage on the node connected to sink or source current from the photodetector is set to a level independent of the amplifier's reset voltage.

### Claim 12 (depends on 1)

The interface circuit of claim 1 wherein the charge subtraction is performed via a clocked capacitor, configured to subtract an amount of charge on the integration capacitor sufficient to return the integrator's output closer to it's reset level.

### Claim 13 (depends on 1)

The interface circuit of claim 1 wherein the charge subtractions will occur until the total amount of charge subtracted corresponds roughly to the current flowing in the photodetector times the frame period, and the total count of comparator triggers is the digitization of the photodetector current.

### Claim 14 (depends on 1)

The interface circuit of claim 1 wherein the bias circuit includes a differential arrangement with at least one blind reference detector whereby the current flowing in the photodetector is approximately constant independent to changes in the sensor's operating temperature.

### Claim 15 (depends on 1)

The interface circuit of claim 1 comprising a sample hold circuit, which samples the residual charge on the integration capacitor at the end of a frame period after the last full LSB charge subtraction has occurred.

### Claim 16 (depends on 15)

The interface circuit of claim 15 wherein the held residual charge is connected to a separate analog to digital converter (ADC) with a smaller charge equivalent LSB than the LSB set by the size of the charge subtraction capacitor and the change of voltage on the charge subtraction capacitor.

### Claim 17 (depends on 16)

The interface circuit of claim 16 wherein the additional ADC is shared amongst a plurality of unit cells.

### Claim 18 (depends on 2)

The interface circuit of claim 2 wherein the photodetectors are an array of micro-bolometers.

### Claim 19 (depends on 3)

The interface circuit of claim 3 wherein the photodetectors are an array of photoconductors.